SCHEMBL940052

SCHEMBL940052

CCON(CC)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL617773 0.83
SCHEMBL973345 0.79
SCHEMBL2127597 0.77
Hydrochloric Acid SCHEMBL5229862 0.76
SCHEMBL6244201 0.73
SCHEMBL10527678 0.73
Benzene SCHEMBL27382614 0.71
SCHEMBL8991847 0.71
SCHEMBL9508251 0.71
SCHEMBL942033 0.69 LMNA (0.31)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 115 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116727658-A Preparation method of copper nano-particles, copper nano-particles and application of copper nano-particles 深圳先进电子材料国际创新研究院 2023-09-12 CN claimed
CN-110256655-A A kind of tannic acid Quito official's epoxy resin and preparation method thereof and preparation can liquid alkali developing negative photoresist 苏州瑞红电子化学品有限公司 2019-09-20 CN claimed
CN-108084331-B A kind of biology base film-forming resin and its photoresist of preparation 江南大学 2019-08-16 CN claimed
EP-3054459-B1 ELECTRODE HAVING EXCELLENT LIGHT TRANSMITTANCE AND METHOD FOR MANUFACTURING SAME ONES ORGANIC NANO ELECTRONIC SYSTEM CO LTD (KR) 2018-07-11 EP claimed
CN-108084331-A A kind of biology base film-forming resin and its photoresist of preparation 江南大学 2018-05-29 CN claimed
CN-103309160-B Negative chemically amplified photoresist and imaging method thereof KEMPUR MICROELECTRONICS, INC. (CN) 2015-08-26 CN claimed
EP-1853671-B1 CONDUCTIVE INKS AND MANUFACTURING METHOD THEREOF INKTEC CO LTD (KR) 2013-07-31 EP claimed
CN-102156385-B Chemical amplification type i-linear positive photoresist composition containing 2,1,4-diazo naphthoquinone sulphonic acid phenolic ester UNIV BEIJING NORMAL 2012-10-10 CN claimed
US-7691294-B2 Conductive inks and manufacturing method thereof INKTEC CO., LTD. (KR) 2010-04-06 US claimed
US-20080206488-A1 Conductive Inks and Manufacturing Method Thereof INKTEC CO., LTD. (KR) 2008-08-28 US claimed
JP-2008531810-A 2008-08-14 JP claimed
EP-1853671-A1 CONDUCTIVE INKS AND MANUFACTURING METHOD THEREOF Inktec Co., Ltd. (KR) 2007-11-14 EP claimed
WO-2006093398-A1 CONDUCTIVE INKS AND MANUFACTURING METHOD THEREOF INKTEC CO., LTD. (KR) 2006-09-08 WO claimed
EP-0250219-B1 Method of storing photographic processing solution KONISHIROKU PHOTO IND (JP) 1994-03-30 EP claimed
US-4814260-A USING DEVELOPER WITH SUBSTITUTED HYDROXYLAMINE PRESERVATIVE; BLEACH-FIXER WITH REDUCED AMOUNTS OF AMINOPOLYCARBOXYLIC ACID AND SULFITE KONISHIROKU PHOTO INDUSTRY CO., LTD. (JP) 1989-03-21 US claimed
EP-0250219-A2 Method of storing photographic processing solution KONICA CORPORATION (JP) 1987-12-23 EP claimed
CN-122011922-A Bottom anti-reflection coating composition and preparation and application thereof 嘉庚创新实验室 2026-05-12 CN disclosed
US-20240030448-A1 CONDUCTIVE MATERIAL DISPERSION, AND METHODS FOR MANUFACTURING POSITIVE ELECTRODE FOR LITHIUM ION SECONDARY BATTERY AND LITHIUM ION SECONDARY BATTERY USING SAME MIKUNI SHIKISO KABUSHIKI KAISHA (JP) 2024-01-25 US disclosed
WO-1994008629-A1 MR IMAGING COMPOSITIONS, BASED ON POLY(ALKYLENEOXIDE) STERLING WINTHROP INC. (US) 1994-04-28 WO disclosed
WO-1994009056-A1 CHELATING POLYMERS STERLING WINTHROP INC. (US) 1994-04-28 WO disclosed