SCHEMBL9817408

SCHEMBL9817408

CCC(C)B(OC)OC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15867187 0.77 TSHR (0.32)
SCHEMBL8966897 0.75 TSHR (0.30)
SCHEMBL8436265 0.73 DNM1 (0.35)
SCHEMBL332719 0.65 TSHR (0.38)
SCHEMBL7633516 0.65 TSHR (0.32)
SCHEMBL2602762 0.62 TSHR (0.30)
SCHEMBL5027220 0.62
Ammonia Solution, Strong SCHEMBL19874799 0.62 TSHR (0.35)
SCHEMBL312679 0.62 TSHR (0.35)
SCHEMBL43618 0.62 TSHR (0.35)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11803122-B2 Chemical amplification-type photosensitive composition, photosensitive dry film, production method of patterned resist layer, production method of plated molded article, compound, and production method of compound TOKYO OHKA KOGYO CO., LTD. (JP) 2023-10-31 US disclosed
US-11754926-B2 Method of forming resist pattern, resist composition and method of producing the same TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-20230273521-A1 CHEMICALLY AMPLIFIED PHOTOSENTIVE COMPOSITION, PHOTOSENSITIVE DRY FILM, PRODUCTION METHOD OF SUBSTRATE HAVING TEMPLATE FOR PLATING, AND PRODUCTION METHOD OF PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2023-08-31 US disclosed
US-20230229084-A1 CHEMICALLY AMPLIFIED PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE DRY FILM, PRODUCTION METHOD OF SUBSTRATE HAVING TEMPLATE FOR PLATING, AND PRODUCTION METHOD OF PLATED ARTICLE TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-20 US disclosed
US-20230127914-A1 RESIST PATTERN FORMATION METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2023-04-27 US disclosed
EP-0188235-B1 PRODUCTION OF OPTICALLY PURE ORGANOBORANES Aldrich Chemical Company, Inc. (US) 1991-12-11 EP disclosed
US-4713380-A Production of optically pure organoboranes ALDRICH-BORANES, INC. (US) 1987-12-15 US disclosed
EP-0188235-A2 Production of optically pure organoboranes Aldrich Chemical Company, Inc. (US) 1986-07-23 EP disclosed