SCHEMBL9908422

SCHEMBL9908422

CC(=O)OC(C)C1CC2CCC1C2

nearest known ligand 0.46

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
HPGD P15428 2/20 0.46
LMNA P02545 1/20 0.46
SMN1; SMN2 Q16637 1/20 0.46
ALDH1A1 P00352 3/20 0.41
KMT2A Q03164 5/20 0.40
MEN1 O00255 3/20 0.40
POLB P06746 2/20 0.40
TSHR P16473 1/20 0.40
NPC1 O15118 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11296271 0.83 HPGD (0.42) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL32688617 0.79 ALDH1A1 (0.48) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL32688870 0.77 HPGD (0.51) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL16900287 0.77 HPGD (0.40) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL19655056 0.75 HPGD (0.41) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL6773057 0.74 ALDH1A1 (0.40) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL6772422 0.74 ALDH1A1 (0.43) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL16900481 0.73 HPGD (0.37) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL18535794 0.73 HPGD (0.40) HPGDLMNASMN1; SMN2ALDH1A1KMT2A
SCHEMBL32689198 0.73 HPGD (0.47) HPGDLMNASMN1; SMN2ALDH1A1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9448482-B2 Pattern forming method, resist pattern formed by the method, method for manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2016-09-20 US disclosed
US-20150253673-A1 PATTERN FORMING METHOD, RESIST PATTERN FORMED BY THE METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-09-10 US disclosed
US-8198016-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-12 US disclosed
US-20090286188-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-19 US disclosed