SCHEMBL9909411

SCHEMBL9909411

C=C(C)C(=O)OC(CCC(C)COC(C)=O)CC(C)C

nearest known ligand 0.45

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.45
TDP1 Q9NUW8 1/20 0.36
ALOX15 P16050 1/20 0.33
USP2 O75604 1/20 0.31
ALDH1A1 P00352 1/20 0.31
CYP3A4 P08684 1/20 0.31
MAPT P10636 1/20 0.31
HPGD P15428 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL92855 0.83 TSHR (0.41) TSHRALDH1A1
SCHEMBL10187195 0.80 TSHR (0.41) TSHRALDH1A1MAPTSMN1; SMN2
SCHEMBL92854 0.80 TSHR (0.43) TSHRALDH1A1
SCHEMBL31435672 0.79 TSHR (0.52) TSHRTDP1ALDH1A1
SCHEMBL8955602 0.78 TSHR (0.50) TSHRTDP1ALOX15ALDH1A1
SCHEMBL6669934 0.78 TSHR (0.44) TSHRALDH1A1
SCHEMBL17506168 0.78 TSHR (0.44) TSHRALDH1A1
SCHEMBL11685876 0.77 TSHR (0.50) TSHRTDP1USP2ALDH1A1CYP3A4
SCHEMBL9876628 0.76 TSHR (0.46) TSHRALDH1A1
SCHEMBL4526188 0.75 TSHR (0.69) TSHRTDP1ALOX15ALDH1A1MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8211618-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-03 US disclosed
US-8198016-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-12 US disclosed
US-20100227273-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-09-09 US disclosed
US-20100159404-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-7741015-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-22 US disclosed
US-20090286188-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-11-19 US disclosed
US-20080199806-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-08-21 US disclosed