SCHEMBL9930638

SCHEMBL9930638

[CH2]C(O)CC(O)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL622233 0.82
SCHEMBL3082021 0.71
SCHEMBL19385015 0.69
SCHEMBL269089 0.69
SCHEMBL108527 0.69
SCHEMBL3388764 0.69
SCHEMBL29022796 0.69
SCHEMBL4448690 0.69
SCHEMBL5059018 0.69
SCHEMBL28743805 0.67

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 18 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2024095926-A1 CLEANING LIQUID AND SUBSTRATE CLEANING METHOD 東京応化工業株式会社 2024-05-10 WO disclosed
CN-117836337-A Biodegradable graft polymers 巴斯夫欧洲公司 2024-04-05 CN disclosed
CN-117813330-A Biodegradable graft polymers 巴斯夫欧洲公司 2024-04-02 CN disclosed
CN-117795048-A Biodegradable graft polymers for dye transfer inhibition 巴斯夫欧洲公司 2024-03-29 CN disclosed
CN-117545785-A Biodegradable graft polymers 巴斯夫欧洲公司 2024-02-09 CN disclosed
US-20230174892-A1 DETERGENT COMPOSITION AND CHEMICAL-MECHANICAL POLISHING COMPOSITION DAICEL CORPORATION (JP) 2023-06-08 US disclosed
US-10597616-B2 Cleaning liquid and method for manufacturing the same TOYOTA OHKA KOGYO CO., LTD. (JP) 2020-03-24 US disclosed
US-10597609-B2 Cleaning liquid, anticorrosion agent, and method for manufacturing the same TOKYO OHKA KOGYO CO., LTD. (JP) 2020-03-24 US disclosed
US-20180187128-A1 CLEANING LIQUID, ANTICORROSION AGENT, AND METHOD FOR MANUFACTURING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2018-07-05 US disclosed
US-20180187133-A1 CLEANING LIQUID AND METHOD FOR MANUFACTURING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2018-07-05 US disclosed
EP-2475000-B1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME WAKO PURE CHEM IND LTD (JP) 2015-07-01 EP disclosed
US-9034810-B2 Processing agent composition for semiconductor surface and method for processing semiconductor surface using same WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2015-05-19 US disclosed
US-9006164-B2 Resist remover composition and method for removing resist using the composition WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2015-04-14 US disclosed
EP-2474862-B1 COMPOSITION FOR REMOVING A RESIST ON A SEMICONDUCTOR SUBSTRATE AND METHOD FOR REMOVING RESIST USING THE COMPOSITION WAKO PURE CHEM IND LTD (JP) 2015-02-25 EP disclosed
EP-2474862-A1 RESIST REMOVER COMPOSITION AND METHOD FOR REMOVING RESIST USING THE COMPOSITION Wako Pure Chemical Industries, Ltd. (JP) 2012-07-11 EP disclosed
EP-2475000-A1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME Wako Pure Chemical Industries, Ltd. (JP) 2012-07-11 EP disclosed
US-20120172274-A1 RESIST REMOVER COMPOSITION AND METHOD FOR REMOVING RESIST USING THE COMPOSITION WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2012-07-05 US disclosed
US-20120157368-A1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2012-06-21 US disclosed