SCHEMBL9940179

SCHEMBL9940179

C=CCC(C(=O)O)C(CC=C)(C(=O)O)S(=O)(=O)O.[KH]

nearest known ligand 0.33

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CYP2C19 P33261 1/20 0.33
GRIK1 P39086 2/20 0.31
GRIK2 Q13002 2/20 0.31
ALDH1A1 P00352 1/20 0.30
TSHR P16473 1/20 0.30
CPA1 P15085 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL88777 0.98 CYP2C19 (0.34) CYP2C19GRIK1GRIK2ALDH1A1TSHR
SCHEMBL131348 0.97 CYP2C19 (0.33) CYP2C19GRIK1GRIK2ALDH1A1TSHR
Ammonia Solution, Strong SCHEMBL7197487 0.97 CYP2C19 (0.33) CYP2C19GRIK1GRIK2ALDH1A1TSHR
SCHEMBL7968681 0.97 CYP2C19 (0.33) CYP2C19GRIK1GRIK2ALDH1A1TSHR
Ammonia Solution, Strong SCHEMBL7197485 0.97 CYP2C19 (0.33) CYP2C19GRIK1GRIK2ALDH1A1TSHR
SCHEMBL3373613 0.86 HTT (0.31) GRIK1GRIK2
SCHEMBL29249896 0.82 CYP2C19 (0.30) CYP2C19
SCHEMBL29249995 0.82 CYP2C19 (0.30) CYP2C19
SCHEMBL1115344 0.81 CHRM1 (0.32)
SCHEMBL1115579 0.79 HSPD1 (0.38) ALDH1A1TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-114846183-B Heater coating agent for false twist machine 竹本油脂株式会社 2023-12-01 CN disclosed
CN-114846183-A Heater coating agent for false twist processing machine 竹本油脂株式会社 2022-08-02 CN disclosed
EP-2475000-B1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME WAKO PURE CHEM IND LTD (JP) 2015-07-01 EP disclosed
US-9034810-B2 Processing agent composition for semiconductor surface and method for processing semiconductor surface using same WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2015-05-19 US disclosed
US-9006164-B2 Resist remover composition and method for removing resist using the composition WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2015-04-14 US disclosed
EP-2474862-B1 COMPOSITION FOR REMOVING A RESIST ON A SEMICONDUCTOR SUBSTRATE AND METHOD FOR REMOVING RESIST USING THE COMPOSITION WAKO PURE CHEM IND LTD (JP) 2015-02-25 EP disclosed
EP-2475000-A1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME Wako Pure Chemical Industries, Ltd. (JP) 2012-07-11 EP disclosed
EP-2474862-A1 RESIST REMOVER COMPOSITION AND METHOD FOR REMOVING RESIST USING THE COMPOSITION Wako Pure Chemical Industries, Ltd. (JP) 2012-07-11 EP disclosed
US-20120172274-A1 RESIST REMOVER COMPOSITION AND METHOD FOR REMOVING RESIST USING THE COMPOSITION WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2012-07-05 US disclosed
US-20120157368-A1 PROCESSING AGENT COMPOSITION FOR SEMICONDUCTOR SURFACE AND METHOD FOR PROCESSING SEMICONDUCTOR SURFACE USING SAME WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 2012-06-21 US disclosed
US-4883586-A INCREASING THE RECOVERY OF MINERAL VALUES USING A COLUMN FLOT-ATION UNIT CELL J. R. SIMPLOT CO. (US) 1989-11-28 US disclosed