SCHEMBL9945787

SCHEMBL9945787

CON1CCC(N2CCCC2)CC1

nearest known ligand 0.45

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
L3MBTL3 Q96JM7 9/20 0.43
L3MBTL1 Q9Y468 8/20 0.43
MBTD1 Q05BQ5 5/20 0.39
CYP2D6 P10635 2/20 0.39
CYP2C19 P33261 2/20 0.39
ALDH1A1 P00352 1/20 0.39
TP53BP1 Q12888 1/20 0.37
L3MBTL4 Q8NA19 1/20 0.37
HRH3 Q9Y5N1 3/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14802764 0.98 L3MBTL3 (0.42) L3MBTL3L3MBTL1MBTD1CYP2D6CYP2C19
SCHEMBL12706415 0.80 SMN1; SMN2 (0.40) L3MBTL3L3MBTL1ALDH1A1
SCHEMBL25820253 0.77 L3MBTL3 (0.39) L3MBTL3L3MBTL1ALDH1A1HRH3
SCHEMBL29332707 0.76 HRH3 (0.33) L3MBTL3L3MBTL1CYP2D6CYP2C19ALDH1A1
SCHEMBL23542683 0.74 L3MBTL3 (0.47) L3MBTL3L3MBTL1MBTD1ALDH1A1TP53BP1
SCHEMBL18951849 0.74 MAPK1 (0.42) L3MBTL3L3MBTL1MBTD1CYP2D6CYP2C19
SCHEMBL12107951 0.73 L3MBTL3 (0.41) L3MBTL3L3MBTL1MBTD1TP53BP1L3MBTL4
SCHEMBL529229 0.73
SCHEMBL26112589 0.73 L3MBTL3 (0.52) L3MBTL3L3MBTL1MBTD1CYP2D6CYP2C19
SCHEMBL26117153 0.73 L3MBTL3 (0.52) L3MBTL3L3MBTL1MBTD1CYP2D6CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8999621-B2 Pattern forming method, chemical amplification resist composition and resist film FUJIFILM CORPORATION (JP) 2015-04-07 US disclosed
US-20150093692-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM USED THEREFOR, AND ELECTRONIC DEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAMEDEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE USING THE SAME FUJIFILM CORPORATION (JP) 2015-04-02 US disclosed
US-8841060-B2 Actinic-ray-sensitive or radiation-sensitive resin composition, resist film and pattern forming method each using the composition, method for preparing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2014-09-23 US disclosed
US-20130004740-A1 ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND PATTERN FORMING METHOD EACH USING THE COMPOSITION, METHOD FOR PREPARING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2013-01-03 US disclosed
US-20120148957-A1 PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2012-06-14 US disclosed