SCHEMBL9966103

SCHEMBL9966103

C=C(C)C(=O)C(NC)c1ccc(OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)S(=O)(=O)NS(=O)(=O)C(F)(F)F)cc1

nearest known ligand 0.38

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
CXCR2 P25025 2/20 0.38
CXCR1 P25024 1/20 0.35
MAPK1 P28482 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
PTPN1 P18031 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9966138 0.87 CXCR2 (0.38) CXCR2CXCR1
SCHEMBL2881973 0.81 CXCR2 (0.40) CXCR2CXCR1
SCHEMBL17831810 0.81 ELANE (0.40) CXCR2CXCR1MAPK1SMN1; SMN2PTPN1
SCHEMBL20444099 0.80 CXCR2 (0.41) CXCR2CXCR1PTPN1
SCHEMBL18499620 0.78 SMN1; SMN2 (0.44) CXCR2MAPK1SMN1; SMN2PTPN1
SCHEMBL12039869 0.78 EGFR (0.34) CXCR2CXCR1MAPK1SMN1; SMN2PTPN1
SCHEMBL12399049 0.77 STS (0.47) CXCR2MAPK1SMN1; SMN2PTPN1
SCHEMBL17831811 0.77 ELANE (0.40) CXCR2CXCR1MAPK1SMN1; SMN2PTPN1
SCHEMBL10204338 0.77 HDAC3 (0.36) CXCR2MAPK1SMN1; SMN2PTPN1
SCHEMBL21191392 0.76 CXCR2 (0.41) CXCR2CXCR1PTPN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20120156618-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-06-21 US disclosed
US-20120082939-A1 ACTIVE LIGHT RAY SENSITIVE OR RADIOACTIVE RAY SENSITIVE RESIN COMPOSITION, AND ACTIVE LIGHT RAY SENSITIVE OR RADIOACTIVE RAY SENSITIVE FILM AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-04-05 US disclosed
US-20110318693-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2011-12-29 US disclosed
US-20110183263-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-07-28 US disclosed