SCHEMBL9966138

SCHEMBL9966138

C=C(C)C(=O)C(NC)c1ccc(OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)S(=O)(=O)O)cc1

nearest known ligand 0.38

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CXCR2 P25025 2/20 0.38
CXCR1 P25024 1/20 0.35
CA12 O43570 1/20 0.30
CA1 P00915 1/20 0.30
CA2 P00918 1/20 0.30
CA9 Q16790 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9966103 0.87 CXCR2 (0.38) CXCR2CXCR1
SCHEMBL2880822 0.80 CXCR2 (0.40) CXCR2CXCR1
SCHEMBL2742190 0.78 ELANE (0.44) CXCR2CXCR1CA1CA2CA9
SCHEMBL2742193 0.76 RXFP1 (0.43) CA12CA1CA2CA9
SCHEMBL15082411 0.76 CXCR2 (0.44) CXCR2CXCR1CA12CA1CA2
SCHEMBL10204305 0.74 HDAC3 (0.39)
SCHEMBL12039866 0.74 EGFR (0.35) CXCR2CXCR1CA12CA1CA2
SCHEMBL10204320 0.73 ALDH1A1 (0.46)
SCHEMBL9963667 0.73 KMT2A (0.35) CXCR2CXCR1
SCHEMBL2742220 0.73 STS (0.46) CA12CA1CA2CA9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20120156618-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-06-21 US disclosed
US-20120082939-A1 ACTIVE LIGHT RAY SENSITIVE OR RADIOACTIVE RAY SENSITIVE RESIN COMPOSITION, AND ACTIVE LIGHT RAY SENSITIVE OR RADIOACTIVE RAY SENSITIVE FILM AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-04-05 US disclosed
US-20110318693-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2011-12-29 US disclosed
US-20110183263-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-07-28 US disclosed