SCHEMBL9973374

SCHEMBL9973374

O=S(O)(O)=C(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Tetrafluoroethylene SCHEMBL3316061 0.70 CA5A (0.60)
SCHEMBL2173230 0.70
SCHEMBL29818845 0.67 TSHR (1.00)
SCHEMBL1938 0.67
Sulfuric Acid SCHEMBL15462484 0.67
Sulfuric Acid SCHEMBL3699224 0.65 CA5A (1.00)
Sulfuric Acid SCHEMBL418399 0.65 CA5A (1.00)
Sulfuric Acid SCHEMBL2555505 0.65 CA5A (1.00)
Sulfuric Acid SCHEMBL110268 0.65 CA5A (1.00)
Sulfuric Acid SCHEMBL8532128 0.65 CA5A (1.00)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160276599-A1 COMPOUND FOR ORGANIC ELECTRIC ELEMENT, ORGANIC ELECTRIC ELEMENT COMPRISING THE SAME AND ELECTRONIC DEVICE THEREOF DUK SAN NEOLUX CO., LTD. (KR) 2016-09-22 US disclosed
US-9235117-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, manufacturing method of electronic device, and electronic device FUJIFILM CORPORATION (JP) 2016-01-12 US disclosed
US-20150380168-A1 THIN-LAYER CAPACITORS WITH LARGE SCALE INTEGRATION SIEMENS AKTIENGESELLSCHAFT (DE) 2015-12-31 US disclosed
US-9152049-B2 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition FUJIFILM CORPORATION (JP) 2015-10-06 US disclosed
US-9128374-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-09-08 US disclosed
US-9097971-B2 Compound, radical polymerization initiator, method for producing compound, polymer, resist composition, and method for forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-04 US disclosed
US-20150079508-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-03-19 US disclosed
US-8937056-B2 Multikinase inhibitors for use in the treatment of cancer EISAI R&D MANAGEMENT CO., LTD. (JP) 2015-01-20 US disclosed
US-8921028-B2 Salt, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2014-12-30 US disclosed
US-20140147790-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2014-05-29 US disclosed
US-20130303489-A1 MULTIKINASE INHIBITORS FOR USE IN THE TREATMENT OF CANCER EISAI R&D MANAGEMENT CO., LTD. (JP) 2013-11-14 US disclosed
US-20130045443-A1 POLYMER, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-02-21 US disclosed
US-20130022911-A1 POLYMER, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-01-24 US disclosed
US-20120231392-A1 SALT, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-09-13 US disclosed
US-20120156617-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-06-21 US disclosed
US-8113116-B2 Lithographic printing plate precursor FUJIFILM CORPORATION (JP) 2012-02-14 US disclosed
US-8039198-B2 Sulfonium salt-containing polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-10-18 US disclosed
US-20090233223-A1 SULFONIUM SALT-CONTAINING POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-09-17 US disclosed
US-20080311515-A1 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2008-12-18 US disclosed
US-20070214987-A1 Lithographic printing plate precursor FUJIFILM CORPORATION 2007-09-20 US disclosed