SCHEMBL10027320

SCHEMBL10027320

CCCC(C)C(=O)CC(C)CC

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.37
CHRM1 P11229 1/20 0.36
AKR1A1 P14550 1/20 0.36
CHRM3 P20309 1/20 0.36
HTR2A P28223 1/20 0.36
HTR2C P28335 1/20 0.36
ADRA1A P35348 1/20 0.36
HRH1 P35367 1/20 0.36
DRD3 P35462 1/20 0.36
SLC6A3 Q01959 1/20 0.36
HDAC1 Q13547 1/20 0.36
HDAC2 Q92769 1/20 0.36
TDP1 Q9NUW8 1/20 0.36
ACE2 Q9BYF1 1/20 0.35
CYP3A4 P08684 2/20 0.34
NFKB1 P19838 2/20 0.34
NPSR1 Q6W5P4 2/20 0.34
FDPS P14324 1/20 0.34
CA1 P00915 2/20 0.34
HDAC7 Q8WUI4 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL109747 0.83 CA1 (0.33) TSHRTDP1ACE2CA1CA2
SCHEMBL11683234 0.81 TDP1 (0.42) TSHRCHRM1AKR1A1CHRM3HTR2A
SCHEMBL28685263 0.79 TSHR (0.32) TSHRCHRM1AKR1A1CHRM3HTR2A
SCHEMBL13538556 0.77 CHRM1 (0.36) TSHRCHRM1AKR1A1CHRM3HTR2A
SCHEMBL27305175 0.77 GABRP (0.38) TSHRCHRM1AKR1A1CHRM3HTR2A
SCHEMBL21478225 0.77 CA1 (0.30) CA1CA2
SCHEMBL15049822 0.77 ACE2 (0.48) CHRM1AKR1A1CHRM3HTR2AHTR2C
SCHEMBL10212333 0.75 CA2 (0.33) TSHRTDP1CA1MAPTCA2
SCHEMBL10890015 0.75
SCHEMBL268557 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 35 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9104101-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-11 US disclosed
US-9104101-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-11 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-8536280-B2 Star polymer and coupling agent for anionic polymerization TOHO CHEMICAL INDUSTRY CO., LTD. (JP) 2013-09-17 US disclosed
US-8536280-B2 Star polymer and coupling agent for anionic polymerization TOHO CHEMICAL INDUSTRY CO., LTD. (JP) 2013-09-17 US disclosed
US-20120282551-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2012-11-08 US disclosed
US-20120282551-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2012-11-08 US disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-20090253075-A1 POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-08 US disclosed
US-20090209726-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2009-08-20 US disclosed
US-20090209726-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2009-08-20 US disclosed
US-20090111961-A1 Acrylic Acid-Based Polymer and Method of Producing the Same NIPPON SODA CO., LTD. (JP) 2009-04-30 US disclosed
US-20090111961-A1 Acrylic Acid-Based Polymer and Method of Producing the Same NIPPON SODA CO., LTD. (JP) 2009-04-30 US disclosed
US-7494759-B2 Positive resist compositions and process for the formation of resist patterns with the same TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-24 US disclosed
US-7494759-B2 Positive resist compositions and process for the formation of resist patterns with the same TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-24 US disclosed
US-20070224538-A1 Positive Resist Compositions and Process for the Formation of Resist Patterns With the Same TOKYO OHKA KOGYO CO., LTD. (JP) 2007-09-27 US disclosed
US-20070224538-A1 Positive Resist Compositions and Process for the Formation of Resist Patterns With the Same TOKYO OHKA KOGYO CO., LTD. (JP) 2007-09-27 US disclosed
EP-1752479-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2007-02-14 EP disclosed