SCHEMBL10027322

SCHEMBL10027322

CCCOc1ccc(-c2ccc(OCC)cc2)cc1

nearest known ligand 0.64

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
NQO1 P15559 1/20 0.64
CYP3A4 P08684 3/20 0.57
CYP2D6 P10635 3/20 0.57
ALDH1A1 P00352 5/20 0.53
SMN1; SMN2 Q16637 5/20 0.53
KDM4E B2RXH2 4/20 0.53
LTA4H P09960 1/20 0.53
TSHR P16473 1/20 0.52
TDP1 Q9NUW8 1/20 0.52
CYP1A2 P05177 2/20 0.52
CYP19A1 P11511 2/20 0.52
CYP2C9 P11712 2/20 0.52
CYP2C19 P33261 2/20 0.52
ACACB O00763 1/20 0.51
ACACA Q13085 1/20 0.51
RAB9A P51151 5/20 0.50
NPC1 O15118 4/20 0.50
HPGD P15428 2/20 0.50
HSD17B10 Q99714 2/20 0.50
GAA P10253 2/20 0.50

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9152649 0.93 CYP3A4 (0.63) CYP3A4CYP2D6ALDH1A1SMN1; SMN2KDM4E
SCHEMBL6836988 0.93 CYP3A4 (0.63) CYP3A4CYP2D6ALDH1A1SMN1; SMN2KDM4E
SCHEMBL17108413 0.93 CYP3A4 (0.63) CYP3A4CYP2D6ALDH1A1SMN1; SMN2KDM4E
4-Ethoxy-1-Propoxybenzene SCHEMBL2841577 0.93 NQO1 (0.74) NQO1CYP2D6ALDH1A1SMN1; SMN2KDM4E
SCHEMBL10022022 0.88 CYP2D6 (0.70) CYP3A4CYP2D6SMN1; SMN2KDM4ELTA4H
SCHEMBL18417193 0.88 NQO1 (0.82) NQO1CYP3A4CYP2D6ALDH1A1SMN1; SMN2
SCHEMBL9155582 0.88 NQO1 (0.82) NQO1CYP3A4CYP2D6ALDH1A1SMN1; SMN2
SCHEMBL5833291 0.88 NQO1 (0.82) NQO1CYP3A4CYP2D6ALDH1A1SMN1; SMN2
SCHEMBL12972522 0.88 KDM4E (0.56) NQO1CYP3A4CYP2D6ALDH1A1SMN1; SMN2
SCHEMBL10027327 0.86 LTA4H (0.70) NQO1ALDH1A1SMN1; SMN2KDM4ELTA4H

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 32 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9104101-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-11 US disclosed
US-9104101-B2 Resist composition, method of forming resist pattern and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-11 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-8536280-B2 Star polymer and coupling agent for anionic polymerization TOHO CHEMICAL INDUSTRY CO., LTD. (JP) 2013-09-17 US disclosed
US-20120282551-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2012-11-08 US disclosed
US-20120282551-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2012-11-08 US disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-8067515-B2 Method of producing an acrylic acid-based polymer NIPPON SODA CO., LTD. (JP) 2011-11-29 US disclosed
US-20090253075-A1 POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-08 US disclosed
US-20090253075-A1 POSITIVE RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-08 US disclosed
US-20090209726-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2009-08-20 US disclosed
US-20090209726-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2009-08-20 US disclosed
US-20090111961-A1 Acrylic Acid-Based Polymer and Method of Producing the Same NIPPON SODA CO., LTD. (JP) 2009-04-30 US disclosed
US-20090111961-A1 Acrylic Acid-Based Polymer and Method of Producing the Same NIPPON SODA CO., LTD. (JP) 2009-04-30 US disclosed
US-7494759-B2 Positive resist compositions and process for the formation of resist patterns with the same TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-24 US disclosed
US-7494759-B2 Positive resist compositions and process for the formation of resist patterns with the same TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-24 US disclosed
US-20070224538-A1 Positive Resist Compositions and Process for the Formation of Resist Patterns With the Same TOKYO OHKA KOGYO CO., LTD. (JP) 2007-09-27 US disclosed
US-20070224538-A1 Positive Resist Compositions and Process for the Formation of Resist Patterns With the Same TOKYO OHKA KOGYO CO., LTD. (JP) 2007-09-27 US disclosed