SCHEMBL10070918

SCHEMBL10070918

CC(C)C(=O)OC1CCCO1

nearest known ligand 0.35

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.35
POLB P06746 1/20 0.35
HPGD P15428 3/20 0.34
HTT P42858 2/20 0.34
TSHR P16473 1/20 0.34
NPSR1 Q6W5P4 1/20 0.34
ALDH1A1 P00352 3/20 0.33
MEN1 O00255 1/20 0.33
KMT2A Q03164 1/20 0.33
GAA P10253 1/20 0.33
SLC6A3 Q01959 2/20 0.32
L3MBTL1 Q9Y468 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11931641 0.94 SLC6A3 (0.37) LMNAPOLBHPGDHTTTSHR
SCHEMBL14640917 0.94 SLC6A3 (0.37) LMNAPOLBHPGDHTTTSHR
SCHEMBL10441223 0.85 POLB (0.37) LMNAPOLBHPGDHTTTSHR
SCHEMBL18544524 0.83 LMNA (0.36) LMNAPOLBHPGDHTTTSHR
SCHEMBL10799911 0.83 SLC6A3 (0.37) LMNAPOLBHPGDHTTTSHR
SCHEMBL786034 0.82 HTT (0.39) LMNAPOLBHPGDHTTTSHR
SCHEMBL10807859 0.81 SLC6A3 (0.36) LMNAPOLBHPGDHTTTSHR
SCHEMBL10957531 0.81 SLC6A3 (0.36) HPGDTSHRNPSR1MEN1KMT2A
SCHEMBL8762244 0.81
SCHEMBL13918183 0.80 SLC6A3 (0.35) HPGDTSHRNPSR1MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20220066323-A1 Laminate, composition, and laminate forming kit FUJIFILM CORPORATION (JP) 2022-03-03 US disclosed
US-9905768-B2 Semiconductor device and insulating layer-forming composition FUJIFILM CORPORATION (JP) 2018-02-27 US disclosed
US-20170054076-A1 SEMICONDUCTOR DEVICE AND INSULATING LAYER-FORMING COMPOSITION FUJIFILM CORPORATION (JP) 2017-02-23 US disclosed
US-8101341-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-24 US disclosed
US-8101341-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-24 US disclosed
US-20100178617-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-15 US disclosed
US-20100178617-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-15 US disclosed