SCHEMBL1133763

SCHEMBL1133763

C[C@H](CCC(=O)OC(C)(C)C)[C@H]1CC[C@H]2[C@@H]3CCC4C[C@H](O)CC(C(=O)C(F)(F)F)[C@]4(C)[C@H]3CC[C@]12C

nearest known ligand 0.59

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
GPBAR1 Q8TDU6 4/20 0.58
VDR P11473 4/20 0.58
HIF1A Q16665 3/20 0.58
CYP2C9 P11712 2/20 0.58
EPHA2 P29317 4/20 0.54
CASP7 P55210 3/20 0.54
MAPK1 P28482 3/20 0.54
USP2 O75604 3/20 0.54
MAPT P10636 3/20 0.54
TP53 P04637 2/20 0.54
HSD17B10 Q99714 2/20 0.54
BLM P54132 2/20 0.54
TDP1 Q9NUW8 2/20 0.54
CYP3A4 P08684 2/20 0.54
LMNA P02545 2/20 0.54
MDM4 O15151 1/20 0.54
HSPD1 P10809 1/20 0.54
TSHR P16473 1/20 0.54
PTPN2 P17706 1/20 0.54
PTPN1 P18031 1/20 0.54

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1133762 1.00 GPBAR1 (0.58) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL8568004 0.91 GPBAR1 (0.61) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL8568002 0.91 GPBAR1 (0.61) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL8102663 0.88 GPBAR1 (0.56) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL13655500 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL22871996 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL4759767 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL22871867 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL18575950 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2
SCHEMBL8736943 0.84 GPBAR1 (0.80) GPBAR1VDRHIF1ACYP2C9EPHA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 69 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-5580694-A ACRYLIC ACID, ACRYLIC ESTER COPOLYMER, RADIATION SENSITIVE ACID GENERATOR INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1996-12-03 US claimed
EP-0690348-A2 Photoresist composition for deep ultraviolet radiation and process for its use International Business Machines Corporation (US) 1996-01-03 EP claimed
US-9851639-B2 Photoacid generating polymers containing a urethane linkage for lithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2017-12-26 US disclosed
US-9422445-B2 Sulfonamide-containing topcoat and photoresist additive compositions and methods of use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2016-08-23 US disclosed
US-20160053129-A1 Sulfonamide-Containing Topcoat and Photoresist Additive Compositions and Methods of Use CENTRAL GLASS CO., LTD. (JP) 2016-02-25 US disclosed
US-9223217-B2 Sulfonamide-containing topcoat and photoresist additive compositions and methods of use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2015-12-29 US disclosed
US-9223209-B2 Sulfonamide-containing photoresist compositions and methods of use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2015-12-29 US disclosed
US-8945808-B2 Self-topcoating resist for photolithography INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2015-02-03 US disclosed
US-20130260313-A1 PHOTOACID GENERATING POLYMERS CONTAINING A URETHANE LINKAGE FOR LITHOGRAPHY CENTRAL GLASS CO., LTD. (JP) 2013-10-03 US disclosed
EP-2285845-B1 LOW OUTGASSING PHOTORESIST COMPOSITIONS IBM (US) 2013-09-04 EP disclosed
US-8323868-B2 Bilayer systems including a polydimethylglutarimide-based bottom layer and compositions thereof INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-12-04 US disclosed
US-20020146638-A1 Norbornene fluoroacrylate copolymers and process for use thereof GLOBALFOUNDRIES U.S. INC. 2002-10-10 US disclosed
US-20020102490-A1 Substituted norbornene fluoroacrylate copolymers and use thereof lithographic photoresist compositions GLOBALFOUNDRIES U.S. INC. 2002-08-01 US disclosed
US-20020090572-A1 Substantially transparent aqueous base soluble polymer system for use in 157 nm resist applications GLOBALFOUNDRIES U.S. INC. 2002-07-11 US disclosed
US-20020081520-A1 Substantially transparent aqueous base soluble polymer system for use in 157 nm resist applications GLOBALFOUNDRIES INC. (KY) 2002-06-27 US disclosed
US-6365321-B1 COPOLYMER WITH ACRYLATE HAVING ACID LABILE GROUP, HOMOGENOUSLY BLENDED WITH PHENOLIC POLYMER WHICH IS PARTIALLY OR WHOLLY PROTECTED INTERNATIONAL BUSINESS MACHINES CORPORATION 2002-04-02 US disclosed
US-6093517-A CONSISTS OF A RADIATION SENSITIVE ACID GENERATOR, A POLYMERIC BINDER AND A DISSOLUTION INHIBITOR CONSISTS OF A CALIX(4)RESORCINARENE PARTIALLY OR WHOLLY PROTECTED WITH ACID-LABILE PROTECTING GROUPS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2000-07-25 US disclosed
US-5786131-A COATING SUBSTRATE WITH FILM COMPRISING RADIATION SENSITIVE ACID GENERATOR, ANDROSTANE-17-ALKYLCARBOXYLATE, AND ACRYLIC POLYMER, EXPOSING, DEVELOPING INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1998-07-28 US disclosed
US-5580694-A ACRYLIC ACID, ACRYLIC ESTER COPOLYMER, RADIATION SENSITIVE ACID GENERATOR INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1996-12-03 US disclosed
EP-0690348-A2 Photoresist composition for deep ultraviolet radiation and process for its use International Business Machines Corporation (US) 1996-01-03 EP disclosed