SCHEMBL119725

SCHEMBL119725

Oc1ccc2c3c(ccc(O)c13)C=C2

nearest known ligand 0.47

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PIM1 P11309 1/20 0.47
HSD17B10 Q99714 3/20 0.38
TSHR P16473 2/20 0.38
APP P05067 2/20 0.38
MAPT P10636 2/20 0.38
HPGD P15428 2/20 0.38
ALOX15 P16050 2/20 0.38
RECQL P46063 2/20 0.38
TDP1 Q9NUW8 2/20 0.38
THRB P10828 1/20 0.38
CASP1 P29466 1/20 0.38
SNCA P37840 1/20 0.38
AURKA O14965 1/20 0.33
CYP1A1 P04798 1/20 0.33
CYP1A2 P05177 1/20 0.33
CDC25B P30305 1/20 0.33
TXNRD1 Q16881 1/20 0.33
TXNRD3 Q86VQ6 1/20 0.33
COPS5 Q92905 1/20 0.33
AURKB Q96GD4 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30727795 1.00 PIM1 (0.47) PIM1HSD17B10TSHRAPPMAPT
SCHEMBL25122116 0.82 PIM1 (0.38) PIM1HSD17B10TSHRAPPMAPT
SCHEMBL29441209 0.79 PIM1 (0.69) PIM1HSD17B10TSHRAPPMAPT
SCHEMBL338244 0.79 PIM1 (0.69) PIM1HSD17B10TSHRAPPMAPT
SCHEMBL1500325 0.79 GAA (0.30) MAPT
SCHEMBL119729 0.71 RECQL (0.58) PIM1HSD17B10TSHRAPPMAPT
Formaldehyde SCHEMBL16280219 0.69 PIM1 (0.56) PIM1HSD17B10TSHRAPPMAPT
SCHEMBL13306162 0.68 IDO1 (0.33) HSD17B10TSHRAPPMAPTHPGD
SCHEMBL25122119 0.66 NQO2 (0.35) HSD17B10TSHRAPPMAPTHPGD
SCHEMBL13318281 0.63 ENPP2 (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 131 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250163200-A1 DIPHENYL(METH)ACRYLAMIDE-CONTAINING THERMOSETTING RESIN COMPOSITION AND CURED PRODUCT THEREFROM NIPPON SODA CO., LTD. (JP) 2025-05-22 US disclosed
EP-4501994-A1 DIPHENYL(METH)ACRYLAMIDE-CONTAINING THERMOSETTING RESIN COMPOSITION AND CURED PRODUCT THEREFROM Nippon Soda Co., Ltd. (JP) 2025-02-05 EP disclosed
US-20240409674-A1 NOVEL POLYMER, RESIN COMPOSITION INCLUDING SAME, AND MOLDED BODY THEREOF NIPPON SODA CO., LTD. (JP) 2024-12-12 US disclosed
US-20240309138-A1 NOVEL (METH)ACRYLAMIDE POLYMER, RESIN COMPOSITION CONTAINING SAME, AND MOLDED BODY THEREOF NIPPON SODA CO., LTD. (JP) 2024-09-19 US disclosed
US-12024590-B2 Resin composition, prepreg, film with resin, metal foil with resin, metal-clad laminate, and wiring board PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. (JP) 2024-07-02 US disclosed
EP-4372019-A1 NOVEL (METH)ACRYLAMIDE POLYMER, RESIN COMPOSITION CONTAINING SAME, AND MOLDED BODY THEREOF Nippon Soda Co., Ltd. (JP) 2024-05-22 EP disclosed
EP-4372015-A1 NOVEL POLYMER, RESIN COMPOSITION INCLUDING SAME, AND MOLDED BODY THEREOF Nippon Soda Co., Ltd. (JP) 2024-05-22 EP disclosed
CN-117597372-A Novel (meth) acrylamide polymer, resin composition containing the same, and molded article thereof 日本曹达株式会社 2024-02-23 CN disclosed
CN-117597371-A Novel polymer, resin composition containing the same, and molded article thereof 日本曹达株式会社 2024-02-23 CN disclosed
US-20230400769-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-12-14 US disclosed
US-20110033803-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-20110033803-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-10 US disclosed
US-20100304297-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-12-02 US disclosed
US-20100304297-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-12-02 US disclosed
US-20100159392-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100159392-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100159404-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100159404-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20100055621-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-04 US disclosed
US-20100055621-A1 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-03-04 US disclosed