SCHEMBL12040249

SCHEMBL12040249

Cn1c(=O)n(CC2(C)CO2)c(=O)n(CC2(C)CO2)c1=O

nearest known ligand 0.33

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
HTT P42858 1/20 0.33
PARG Q86W56 1/20 0.31
TP53 P04637 1/20 0.30
HBB P68871 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30
KDM4E B2RXH2 1/20 0.30
ALDH1A1 P00352 1/20 0.30
LMNA P02545 1/20 0.30
HIF1A Q16665 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL123316 0.92 TP53 (0.34) TP53HBBSMN1; SMN2
SCHEMBL6153134 0.92 TP53 (0.34) TP53HBBSMN1; SMN2
SCHEMBL10818548 0.82 GABRP (0.32)
SCHEMBL11189216 0.78 APEX1 (0.36)
SCHEMBL20090066 0.78 PARG (0.46) HTTPARG
SCHEMBL11323944 0.78 HTT (0.38) HTTALDH1A1
SCHEMBL11184084 0.78 CYP3A4 (0.55) PARGSMN1; SMN2KDM4EALDH1A1
SCHEMBL11188385 0.78 HTT (0.38) HTTALDH1A1
SCHEMBL11183800 0.78 CYP3A4 (0.55) PARGSMN1; SMN2KDM4EALDH1A1
SCHEMBL5542385 0.78 CYP1A2 (0.50) PARGSMN1; SMN2ALDH1A1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8623745-B2 Composition for forming gate insulating film for thin-film transistor NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-01-07 US disclosed
US-8623745-B2 Composition for forming gate insulating film for thin-film transistor NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-01-07 US disclosed
US-20110318907-A1 COMPOSITION FOR FORMING GATE INSULATING FILM FOR THIN-FILM TRANSISTOR NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2011-12-29 US disclosed
US-20110318907-A1 COMPOSITION FOR FORMING GATE INSULATING FILM FOR THIN-FILM TRANSISTOR NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2011-12-29 US disclosed