SCHEMBL120504

SCHEMBL120504

O=C(CC[C@@H](NC(=O)OCC1c2ccccc2-c2ccccc21)C(=O)O)NCc1ccc2ccccc2c1

nearest known ligand 0.55

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
▸ TLR2 O60603 2/20 0.55
▸ MDM4 O15151 3/20 0.47
▸ TP53 P04637 3/20 0.47
▸ TGM2 P21980 1/20 0.46
▸ MDM2 Q00987 6/20 0.46
▸ SLC17A5 Q9NRA2 1/20 0.44
▸ PTPN1 P18031 2/20 0.43
▸ KMT2A Q03164 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL119437 0.89 TLR2 (0.60) TLR2MDM4TP53MDM2KMT2A
SCHEMBL31370449 0.89 TLR2 (0.60) TLR2MDM4TP53MDM2KMT2A
SCHEMBL119476 0.85 TLR2 (0.55) TLR2MDM4TP53TGM2MDM2
SCHEMBL25353937 0.85 TLR2 (0.56) TLR2MDM4TP53MDM2SLC17A5
SCHEMBL25353942 0.85 TLR2 (0.56) TLR2MDM4TP53MDM2SLC17A5
SCHEMBL31369428 0.85 TLR2 (0.53) TLR2MDM4TP53MDM2SLC17A5
SCHEMBL799706 0.84 MDM4 (0.52) MDM4TP53MDM2SLC17A5PTPN1
SCHEMBL29370428 0.84 MDM4 (0.52) MDM4TP53MDM2SLC17A5PTPN1
SCHEMBL3736523 0.84 MDM4 (0.52) MDM4TP53MDM2SLC17A5PTPN1
SCHEMBL1514663 0.84 MDM4 (0.52) MDM4TP53MDM2SLC17A5PTPN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 — — US disclosed
US-8895231-B2 Patterning process and resist composition SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-25 — — US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 — — US disclosed
US-20120058428-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-08 — — US disclosed
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