SCHEMBL12239454

SCHEMBL12239454

O=C(O)C1CCCCC1C(=O)OC(C(F)F)C(F)(F)F

nearest known ligand 0.45

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.33
ALDH1A1 P00352 2/20 0.33
PEPD P12955 1/20 0.33
MAPT P10636 1/20 0.32
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
L3MBTL1 Q9Y468 1/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12256216 0.87
SCHEMBL13833054 0.85 SLC6A2 (0.38) ALDH1A1PEPDTP53CYP3A4SMN1; SMN2
SCHEMBL12019105 0.83 EPHX1 (0.33)
SCHEMBL12019083 0.79 ALDH1A1 (0.35) LMNAALDH1A1MAPTKMT2ASMN1; SMN2
SCHEMBL14295881 0.78 ACE (0.32) LMNAALDH1A1SMN1; SMN2
SCHEMBL13849635 0.78 PEPD (0.34) PEPDTP53CYP3A4SMN1; SMN2
SCHEMBL12019086 0.77 ALDH1A1 (0.37) LMNAALDH1A1MAPTKMT2ASMN1; SMN2
SCHEMBL13849578 0.75 PEPD (0.35) LMNAALDH1A1PEPDTP53CYP3A4
SCHEMBL6449948 0.75 PEPD (0.33) PEPD
SCHEMBL22006642 0.74 TP53 (0.36) TP53CYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20120322007-A1 PATTERN FORMING METHOD, CHEMICAL AMPLIFICATION RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2012-12-20 US disclosed
US-20120288796-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-15 US disclosed
US-8039198-B2 Sulfonium salt-containing polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-10-18 US disclosed
US-20090233223-A1 SULFONIUM SALT-CONTAINING POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-09-17 US disclosed
EP-2101217-A1 Sulfonium salt-containing polymer, resist compositon, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2009-09-16 EP disclosed