SCHEMBL130771

SCHEMBL130771

CCC(C)(C)C(=O)OC1CC(C)CCC1C(C)C

nearest known ligand 0.53

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
EPHX1 P07099 3/20 0.51
CYP19A1 P11511 2/20 0.49
ALDH1A1 P00352 8/20 0.47
HPGD P15428 2/20 0.47
MAPT P10636 3/20 0.43
TSHR P16473 2/20 0.43
USP2 O75604 1/20 0.43
LMNA P02545 1/20 0.43
NPSR1 Q6W5P4 1/20 0.43
MEN1 O00255 1/20 0.42
KMT2A Q03164 1/20 0.42
TRPM8 Q7Z2W7 1/20 0.42
KDM4E B2RXH2 1/20 0.42
GAA P10253 1/20 0.42
MAPK1 P28482 1/20 0.42
NFE2L2 Q16236 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7772472 0.86 EPHX1 (0.49) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL10139342 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL13253745 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL20719903 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL19670085 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL20328573 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL14822843 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL10139341 0.85 EPHX1 (0.56) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL10115938 0.84 ALDH1A1 (0.46) EPHX1CYP19A1ALDH1A1HPGDMAPT
SCHEMBL21623926 0.84 EPHX1 (0.55) EPHX1CYP19A1ALDH1A1HPGDMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9383645-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, manufacturing method of electronic device, and electronic device FUJIFILM CORPORATION (JP) 2016-07-05 US disclosed
US-9250519-B2 Pattern forming method and actinic ray-sensitive or radiation-sensitive resin composition for use in the method FUJIFILM CORPORATION (JP) 2016-02-02 US disclosed
US-9052594-B2 Positive photosensitive composition and method of forming pattern using the same FUJIFILM CORPORATION (JP) 2015-06-09 US disclosed
US-20150118621-A1 METHOD OF FORMING PATTERN AND ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD FUJIFILM CORPORATION (JP) 2015-04-30 US disclosed
US-20150111135-A1 PATTERN FORMING METHOD AND ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD FUJIFILM CORPORATION (JP) 2015-04-23 US disclosed
US-20140242505-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2014-08-28 US disclosed
US-20120058431-A1 POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING PATTERN USING THE SAME FUJIFILM CORPORATION (JP) 2012-03-08 US disclosed
US-20100203445-A1 NEGATIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2010-08-12 US disclosed
US-20080206668-A1 NEGATIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-08-28 US disclosed
US-20070172761-A1 Positive photosensitive composition and method of forming pattern using the same FUJIFILM CORPORATION (JP) 2007-07-26 US disclosed