SCHEMBL1323593

SCHEMBL1323593

C=C(C)C(=O)OC(C)OCCOC(C)=O

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 5/20 0.44
THRB P10828 1/20 0.42
ALDH1A1 P00352 5/20 0.38
CHRM5 P08912 2/20 0.34
CHRM1 P11229 2/20 0.34
CHRM3 P20309 2/20 0.34
PGR P06401 1/20 0.34
CHRM2 P08172 1/20 0.34
CHRM4 P08173 1/20 0.34
HTR1A P08908 1/20 0.34
CHRNB2 P17787 1/20 0.34
TBXA2R P21731 1/20 0.34
CHRNB4 P30926 1/20 0.34
CHRNA3 P32297 1/20 0.34
CHRNA7 P36544 1/20 0.34
CHRNA4 P43681 1/20 0.34
SMN1; SMN2 Q16637 1/20 0.34
CHRNA10 Q9GZZ6 1/20 0.34
CHRNA9 Q9UGM1 1/20 0.34
ALOX15 P16050 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12101451 0.91 THRB (0.52) TSHRTHRBALDH1A1TDP1
SCHEMBL3267819 0.91 TSHR (0.47) TSHRTHRBALDH1A1
SCHEMBL13943431 0.86 THRB (0.56) TSHRTHRBALDH1A1HSD17B10TDP1
SCHEMBL7717191 0.86 THRB (0.50) TSHRTHRBALDH1A1CHRM1CHRM2
SCHEMBL17049497 0.85 THRB (0.44) TSHRTHRBALDH1A1
SCHEMBL5533901 0.85 THRB (0.44) TSHRTHRBALDH1A1
SCHEMBL1324055 0.84 TSHR (0.41) TSHRTHRBALDH1A1
SCHEMBL27388787 0.83 TSHR (0.46) TSHRTHRBALDH1A1SMN1; SMN2HSD17B10
SCHEMBL3855601 0.83 TSHR (0.44) TSHRTHRBALDH1A1TDP1
SCHEMBL8492857 0.82 THRB (0.40) TSHRTHRBALDH1A1LMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11643489-B2 (Meth)acrylic copolymer, polymer solution, polymer-containing composition, anti-fouling coating composition, and method for producing (meth)acrylic copolymer MITSUBISHI CHEMICAL CORPORATION (JP) 2023-05-09 US disclosed
US-20180201797-A1 (METH)ACRYLIC COPOLYMER, POLYMER SOLUTION, POLYMER-CONTAINING COMPOSITION, ANTI-FOULING COATING COMPOSITION, AND METHOD FOR PRODUCING (METH)ACRYLIC COPOLYMER MITSUBISHI CHEMICAL CORPORATION (JP) 2018-07-19 US disclosed
US-20180051179-A1 ANTIFOULING COATING COMPOSITION MITSUBISHI CHEMICAL CORPORATION (JP) 2018-02-22 US disclosed
US-8378016-B2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-02-19 US disclosed
US-8298746-B2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-10-30 US disclosed
CN-101021683-B Chemical-amplification positive photoresist composition SUMITOMO CHEMICAL CO 2012-01-04 CN disclosed
US-8062830-B2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-11-22 US disclosed
US-8057983-B2 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-11-15 US disclosed
US-20110165519-A1 RESIN SUITABLE FOR AN ACID GENERATOR AND A CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION CONTAINING THE SAME ANDO NOBUO 2011-07-07 US disclosed
US-7932334-B2 Resin suitable for an acid generator SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-04-26 US disclosed
US-20100010129-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-01-14 US disclosed
CN-101614958-A Chemical enlargement type positive corrosion-resisting agent composition SUMITOMO CHEMICAL CO 2009-12-30 CN disclosed
US-20090269695-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-10-29 US disclosed
CN-101566798-A Chemically amplified positive resist composition SUMITOMO CHEMICAL CO (JP) 2009-10-28 CN disclosed
CN-101566797-A Chemically amplified positive resist composition SUMITOMO CHEMICAL CO (JP) 2009-10-28 CN disclosed
US-20090263742-A1 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-10-22 US disclosed
US-20070218401-A1 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-09-20 US disclosed
CN-101021683-A Chemical-amplification positive photoresist composition SUMITOMO CHEMICAL CO (JP) 2007-08-22 CN disclosed
US-20070149702-A1 Resin suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED 2007-06-28 US disclosed
US-5994025-A MIXTURE OF POLYMER AND ACID GENERATOR NEC CORPORATION (JP) 1999-11-30 US disclosed