SCHEMBL13296190

SCHEMBL13296190

CCC(C)(C)C(=O)OCC(O)COc1c(I)cc(I)cc1I

nearest known ligand 0.35

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
▸ LMNA P02545 3/20 0.32
▸ CYP1A2 P05177 2/20 0.32
▸ KDM4E B2RXH2 1/20 0.32
▸ SMN1; SMN2 Q16637 1/20 0.32
▸ MAPT P10636 2/20 0.32
▸ GLA P06280 1/20 0.32
▸ AR P10275 2/20 0.31
▸ VDR P11473 1/20 0.31
▸ POLB P06746 1/20 0.31
▸ NPSR1 Q6W5P4 1/20 0.31
▸ HMGCR P04035 2/20 0.30
▸ ADRB2 P07550 1/20 0.30
▸ ADRB1 P08588 1/20 0.30
▸ ADRB3 P13945 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14346380 0.80 ADRB2 (0.38) ADRB2ADRB1ADRB3
SCHEMBL12135548 0.78 HMGCR (0.40) LMNAKDM4EHMGCRADRB2ADRB1
SCHEMBL13296189 0.76 ADRB2 (0.37) CYP1A2ADRB2ADRB1ADRB3
SCHEMBL8656427 0.76 TSHR (0.42) LMNACYP1A2KDM4ESMN1; SMN2MAPT
SCHEMBL21701054 0.75 TTR (0.34) POLB
SCHEMBL13296228 0.75 ADRB2 (0.48) MAPTADRB2ADRB1ADRB3
SCHEMBL12889011 0.74 CYP2D6 (0.51) LMNACYP1A2MAPTPOLBNPSR1
SCHEMBL10636603 0.74 TSHR (0.40) LMNACYP1A2KDM4ESMN1; SMN2MAPT
SCHEMBL12691395 0.74 HMGCR (0.36) LMNAKDM4EHMGCRADRB2ADRB1
SCHEMBL13296218 0.73 ADRB2 (0.48) ADRB2ADRB1ADRB3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7736822-B2 Resist underlayer coating forming composition for mask blank, mask blank and mask HOYA CORPORATION (JP) 2010-06-15 — — US disclosed
US-20100081081-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION FOR ELECTRON BEAM LITHOGRAPHY NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2010-04-01 — — US disclosed
US-7309560-B2 Composition for forming anti-reflective coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2007-12-18 — — US disclosed
US-20070190459-A1 Resist underlayer coating forming composition for mask blank, mask blank and mask HOYA CORPORATION (JP) 2007-08-16 — — US disclosed
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