SCHEMBL13327360

SCHEMBL13327360

O=C1C2CCC3C=CC3C2C(=O)N1OS(=O)(=O)C(F)(F)F

nearest known ligand 0.35

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
POLB P06746 1/20 0.33
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL20176706 0.86 POLB (0.44) POLBKMT2A
SCHEMBL14564324 0.80 ALDH1A1 (0.46) KMT2A
SCHEMBL14448181 0.80 ALDH1A1 (0.46) KMT2A
SCHEMBL107102 0.80 ALDH1A1 (0.46) KMT2A
SCHEMBL14491491 0.80 ALDH1A1 (0.46) KMT2A
SCHEMBL4834444 0.80 ALDH1A1 (0.36) POLBKMT2A
SCHEMBL13327361 0.77
SCHEMBL4831836 0.74
SCHEMBL14492328 0.74
SCHEMBL14492326 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7714316-B2 Method of manufacturing semiconductor device, acid etching resistance material and copolymer KABUSHIKI KAISHA TOSHIBA (JP) 2010-05-11 US disclosed
US-7445881-B2 Method of manufacturing semiconductor device, acid etching resistant material and copolymer KABUSHIKI KAISHA TOSHIBA (JP) 2008-11-04 US disclosed
US-20080261149-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, ACID ETCHING RESISTANCE MATERIAL AND COPOLYMER ASAKAWA KOJI 2008-10-23 US disclosed
US-20070138139-A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, ACID ETCHING RESISTANCE MATERIAL AND COPOLYMER ASAKAWA KOJI 2007-06-21 US disclosed