SCHEMBL13588293

SCHEMBL13588293

C=C(C)C(=O)OC1CC(C(=O)OC2CCCC2)C2CC1OC2=O

nearest known ligand 0.34

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.32
NPC1 O15118 1/20 0.32
POLB P06746 1/20 0.32
MAPT P10636 1/20 0.32
PKM P14618 1/20 0.32
HTT P42858 1/20 0.32
RECQL P46063 1/20 0.32
RAB9A P51151 1/20 0.32
ATM Q13315 1/20 0.32
TDP1 Q9NUW8 1/20 0.32
GPX4 P36969 1/20 0.31
CHRM2 P08172 1/20 0.31
CHRM4 P08173 1/20 0.31
CHRM5 P08912 1/20 0.31
CHRM1 P11229 1/20 0.31
CHRM3 P20309 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13588294 0.99 CHRM2 (0.32) KDM4ENPC1POLBMAPTPKM
SCHEMBL13938555 0.86
SCHEMBL443886 0.85 KDM4E (0.34) KDM4ENPC1POLBMAPTPKM
SCHEMBL13328133 0.84 GPX4 (0.35) KDM4ENPC1POLBMAPTPKM
SCHEMBL13939249 0.82 KDM4E (0.35) KDM4ENPC1POLBMAPTPKM
SCHEMBL13939248 0.81 KDM4E (0.31) KDM4ENPC1POLBMAPTPKM
SCHEMBL13938556 0.80 KDM4E (0.32) KDM4ENPC1POLBMAPTPKM
SCHEMBL14026093 0.80 CHRM2 (0.34) NPC1POLBHTTRAB9ACHRM2
SCHEMBL13939246 0.80 KDM4E (0.31) KDM4ENPC1POLBMAPTPKM
SCHEMBL14026092 0.79 CHRM2 (0.36) NPC1POLBHTTRAB9ACHRM2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7629106-B2 Resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-12-08 US disclosed
US-7491483-B2 Polymers, positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-02-17 US disclosed
US-7449277-B2 Positive resist compositions and patterning process SHIN-ETSU CHEMICAL C., LTD (JP) 2008-11-11 US disclosed
US-7368218-B2 Positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-05-06 US disclosed