SCHEMBL13607355

SCHEMBL13607355

CCC(C)(CO)C(=O)OC12CC3CC(C1)OC(=O)C(C3)C2

nearest known ligand 0.36

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
NAAA Q02083 1/20 0.36
TSHR P16473 1/20 0.35
NPSR1 Q6W5P4 1/20 0.35
CYP17A1 P05093 1/20 0.33
CYP19A1 P11511 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL107043 0.87 NAAA (0.38) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL19261124 0.85 NAAA (0.36) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL13817685 0.85 NAAA (0.40) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL12628479 0.80 CYP19A1 (0.43) NAAANPSR1CYP17A1CYP19A1
SCHEMBL25515592 0.80 NAAA (0.36) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL10186544 0.80 TSHR (0.45) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL13609146 0.80 TSHR (0.38) NAAATSHRNPSR1CYP19A1
SCHEMBL12287632 0.80 TSHR (0.47) NAAATSHRNPSR1CYP17A1CYP19A1
SCHEMBL25521627 0.78 TSHR (0.34) NAAATSHRNPSR1
SCHEMBL15745514 0.78 NAAA (0.30) NAAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10018913-B2 Active-light-sensitive or radiation-sensitive resin composition, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2018-07-10 US disclosed
US-20170115569-A1 ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-04-27 US disclosed
US-20090274975-A1 POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH FUJIFILM CORPORATION (JP) 2009-11-05 US disclosed