SCHEMBL13898474

SCHEMBL13898474

CC(OCCOc1ccc(C2CCCCC2)cc1)C(C)(C)C

nearest known ligand 0.56

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
HRH3 Q9Y5N1 13/20 0.51
KCNH2 Q12809 4/20 0.51
CYP2C9 P11712 4/20 0.41
CYP3A4 P08684 3/20 0.41
NFE2L2 Q16236 1/20 0.40
PPARG P37231 2/20 0.39
PPARA Q07869 1/20 0.39
KDM4E B2RXH2 2/20 0.39
ALDH1A1 P00352 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10228460 0.87 HRH3 (0.52) HRH3KCNH2CYP2C9CYP3A4NFE2L2
SCHEMBL10274540 0.87 HRH3 (0.55) HRH3KCNH2CYP2C9CYP3A4NFE2L2
SCHEMBL16590942 0.87 HRH3 (0.47) HRH3KCNH2CYP2C9CYP3A4NFE2L2
SCHEMBL14443349 0.85 HRH3 (0.52) HRH3KCNH2CYP2C9CYP3A4KDM4E
SCHEMBL19968012 0.83 HRH3 (0.51) HRH3KCNH2CYP2C9CYP3A4KDM4E
SCHEMBL683429 0.83 HRH3 (0.55) HRH3KCNH2CYP2C9CYP3A4KDM4E
SCHEMBL14998997 0.83 HRH3 (0.46) HRH3KCNH2CYP2C9CYP3A4NFE2L2
SCHEMBL14461654 0.82 HRH3 (0.50) HRH3KCNH2CYP2C9CYP3A4KDM4E
SCHEMBL14461652 0.82 HRH3 (0.50) HRH3KCNH2CYP2C9CYP3A4KDM4E
SCHEMBL14094041 0.82 HRH3 (0.50) HRH3KCNH2CYP2C9CYP3A4KDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9563121-B2 Actinic ray-sensitive or radiation-sensitive resin composition, and, actinic ray-sensitive or radiation-sensitive film and pattern forming method, each using the composition FUJIFILM CORPORATION (JP) 2017-02-07 US disclosed
US-9563121-B2 Actinic ray-sensitive or radiation-sensitive resin composition, and, actinic ray-sensitive or radiation-sensitive film and pattern forming method, each using the composition FUJIFILM CORPORATION (JP) 2017-02-07 US disclosed
US-20140342275-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM AND PATTERN FORMING METHOD, EACH USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2014-11-20 US disclosed
US-7498116-B2 Resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2009-03-03 US disclosed
US-7498116-B2 Resist composition and pattern formation method using the same FUJIFILM CORPORATION (JP) 2009-03-03 US disclosed
US-20080241750-A1 RESIST COMPOSITION AND PATTERN FORMATION METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
US-20080241750-A1 RESIST COMPOSITION AND PATTERN FORMATION METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed