SCHEMBL14213229

SCHEMBL14213229

CCC(C)(C)C(=O)OCC(C)(O)C1CC2CCC1C2

nearest known ligand 0.36

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
EPHX2 P34913 1/20 0.36
GRM1 Q13255 2/20 0.36
HMGCR P04035 1/20 0.31
CYP19A1 P11511 1/20 0.31
HSD11B1 P28845 1/20 0.31
ALDH1A1 P00352 2/20 0.30
NPC1 O15118 1/20 0.30
MAPT P10636 1/20 0.30
HPGD P15428 1/20 0.30
MAPK1 P28482 1/20 0.30
RAB9A P51151 1/20 0.30
GFER P55789 1/20 0.30
L3MBTL1 Q9Y468 1/20 0.30
ATM Q13315 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6367094 0.78 EPHX2 (0.36) EPHX2GRM1CYP19A1HSD11B1ALDH1A1
SCHEMBL106940 0.78 EPHX2 (0.36) EPHX2GRM1CYP19A1HSD11B1ALDH1A1
SCHEMBL3410109 0.78 ALDH1A1 (0.36) EPHX2GRM1CYP19A1ALDH1A1ATM
SCHEMBL107020 0.77 EPHX2 (0.37) EPHX2GRM1ALDH1A1MAPTHPGD
SCHEMBL6367599 0.77 EPHX2 (0.35) EPHX2GRM1HSD11B1ALDH1A1NPC1
SCHEMBL12972013 0.77 CYP19A1 (0.35) EPHX2CYP19A1HSD11B1ALDH1A1NPC1
SCHEMBL14213231 0.76 HMGCR (0.31) HMGCR
SCHEMBL18802894 0.76 EPHX2 (0.36) EPHX2GRM1ALDH1A1MAPTHPGD
SCHEMBL47411 0.76 GRM1 (0.39) EPHX2GRM1HMGCRCYP19A1HSD11B1
SCHEMBL2607560 0.75 HMGCR (0.43) EPHX2GRM1HMGCRHSD11B1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8987386-B2 Method of producing polymeric compound, resist composition, and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-03-24 US disclosed
US-8945812-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-02-03 US disclosed
US-8911928-B2 Resist composition, method of forming resist pattern, polymeric compound and method of producing the same TOKYO OHKA KOGYO CO., LTD. (JP) 2014-12-16 US disclosed
US-20130244176-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-09-19 US disclosed
US-20120328993-A1 METHOD OF PRODUCING POLYMERIC COMPOUND, RESIST COMPOSITION, AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-27 US disclosed
US-20120308928-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-06 US disclosed