SCHEMBL14407722

SCHEMBL14407722

CCSc1c(F)c(F)c(S(=O)(=O)O)c(F)c1F

nearest known ligand 0.49

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
CA1 P00915 12/20 0.49
CA2 P00918 12/20 0.49
CA12 O43570 10/20 0.49
CA7 P43166 10/20 0.49
CA13 Q8N1Q1 10/20 0.49
CA9 Q16790 4/20 0.49
CA4 P22748 2/20 0.44
CA6 P23280 2/20 0.44
CA5A P35218 2/20 0.44
CA14 Q9ULX7 2/20 0.44
CA5B Q9Y2D0 2/20 0.44
CA3 P07451 1/20 0.44
MMP1 P03956 1/20 0.30
MMP2 P08253 1/20 0.30
MMP9 P14780 1/20 0.30
MMP8 P22894 1/20 0.30
MMP13 P45452 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19296219 0.83 CA12 (0.52) CA1CA2CA12CA7CA13
SCHEMBL17399676 0.79 CA2 (0.41) CA1CA2CA12CA7CA13
SCHEMBL12172747 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL16313656 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL112773 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL12689958 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL10172873 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL2611770 0.79 CA2 (0.53) CA1CA2CA12CA7CA13
SCHEMBL2314662 0.78 CA12 (0.40) CA1CA2CA12CA7CA13
SCHEMBL683699 0.77 CA1 (0.40) CA1CA2CA12CA7CA13

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7273690-B2 Positive resist composition for immersion exposure and method of pattern formation with the same FUJIFILM CORPORATION (JP) 2007-09-25 US disclosed
US-20070087288-A1 Positive-working photosensitive composition and pattern forming method using the same FUJIFILM CORPORATION 2007-04-19 US disclosed
EP-1764647-A2 Positive resist composition for immersion exposure and pattern-forming method using the same FUJIFILM Corporation (JP) 2007-03-21 EP disclosed