SCHEMBL1470652

SCHEMBL1470652

COc1ccc(/C(C#N)=N\OS(=O)(=O)c2ccc(C)cc2)cc1

nearest known ligand 0.49

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 7/20 0.49
GAA P10253 3/20 0.49
HPGD P15428 2/20 0.49
PKM P14618 1/20 0.49
MAPT P10636 4/20 0.44
TP53 P04637 2/20 0.44
LMNA P02545 2/20 0.44
CYP1A2 P05177 1/20 0.44
CYP3A4 P08684 1/20 0.44
CYP2C9 P11712 1/20 0.44
CYP2C19 P33261 1/20 0.44
EP300 Q09472 1/20 0.44
KAT2A Q92830 1/20 0.44
KAT2B Q92831 1/20 0.44
KMT2A Q03164 3/20 0.43
TDP1 Q9NUW8 1/20 0.43
KDM4E B2RXH2 2/20 0.41
NPC1 O15118 2/20 0.41
POLB P06746 1/20 0.41
RAB9A P51151 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1470654 1.00 ALDH1A1 (0.49) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL1482753 1.00 ALDH1A1 (0.49) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL5918261 0.95 EP300 (0.45) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL5918260 0.95 EP300 (0.45) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL10097224 0.92 ALDH1A1 (0.40) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL10083959 0.92 ALDH1A1 (0.40) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL18957974 0.92 ALDH1A1 (0.40) ALDH1A1GAAHPGDPKMMAPT
SCHEMBL28491315 0.89 ALDH1A1 (0.48) ALDH1A1GAAHPGDMAPTTP53
SCHEMBL36510 0.88 HSD11B1 (0.46) ALDH1A1GAAPKMMAPTLMNA
SCHEMBL36511 0.88 HSD11B1 (0.46) ALDH1A1GAAPKMMAPTLMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 70 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9650538-B2 Method for manufacturing micro-structure SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-05-16 US claimed
US-20140296380-A1 METHOD FOR MANUFACTURING MICRO-STRUCTURE SHINETSU CHEMICAL CO (JP) 2014-10-02 US claimed
US-6635400-B2 Alkali-insoluble polymer having acidic groups protected with acid labile groups, photoacid generator, and 1,2-naphthoquinonediazidosulfonyl group-bearing compound; high resolution; plating resistance SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-10-21 US claimed
US-5916728-A RESIN WHICH IS CONVERTED TO ALKALI-SOLUBLE FROM ALKALI-INSOLUBLE OR ALKALI-SLIGHTLY SOLUBLE BY THE ACTION OF AN ACID, ACID GENERATOR AND TERTIARY AMINE COMPOUND HAVING AN ALIPHATIC HYDROXYL GROUP. SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1999-06-29 US claimed
EP-4273624-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, INTERLAYER INSULATING FILM, SURFACE PROTECTION FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-08 EP disclosed
US-11460774-B2 Photosensitive resin composition, photosensitive dry film, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-10-04 US disclosed
US-11256174-B2 Pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-02-22 US disclosed
EP-3671345-B1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2022-02-02 EP disclosed
CN-106019830-B Resist composition and method for producing resist pattern 住友化学株式会社 2021-08-20 CN disclosed
US-20200201182-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-06-25 US disclosed
EP-3671345-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, AND PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2020-06-24 EP disclosed
EP-3367164-B1 PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2019-11-13 EP disclosed
EP-0837367-A2 Positive resist composition comprising a dipyridyl compound SUMITOMO CHEMICAL COMPANY LIMITED (JP) 1998-04-22 EP disclosed
US-5650262-A High-resolution negative photoresist with wide process latitude OLIN MICROELECTRONIC CHEMICALS, INC. 1997-07-22 US disclosed
EP-0780729-A1 Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1997-06-25 EP disclosed
US-5627011-A High resolution i-line photoresist of high sensitivity CIBA-GEIGY CORPORATION (US) 1997-05-06 US disclosed
US-4544752-A TREATMENT OF GOUT; ANTIARTHRITIC AGENTS ELI LILLY AND COMPANY (US) 1985-10-01 US disclosed
EP-0048615-B1 IMPROVEMENTS IN OR RELATING TO 3-ARYL-5-ISOTHIAZOLE DERIVATIVES ELI LILLY AND COMPANY (US) 1984-05-30 EP disclosed
US-4346094-A ENZYME INHIBITORS ELI LILLY AND COMPANY (US) 1982-08-24 US disclosed
EP-0048615-A1 Improvements in or relating to 3-aryl-5-isothiazole derivatives ELI LILLY AND COMPANY (US) 1982-03-31 EP disclosed