SCHEMBL14749149

SCHEMBL14749149

C=CC(=O)OC(O)(C(F)(F)F)C(F)(F)F

nearest known ligand 0.35

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 4/20 0.35
TP53 P04637 3/20 0.35
HIF1A Q16665 3/20 0.35
CYP3A4 P08684 2/20 0.35
MAPK1 P28482 1/20 0.35
SMN1; SMN2 Q16637 1/20 0.35
TSHR P16473 6/20 0.34
HSD17B10 Q99714 1/20 0.34
HPGD P15428 1/20 0.31
LMNA P02545 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6725111 0.82
SCHEMBL15836525 0.81 TSHR (0.34) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL225025 0.80 ALDH1A1 (0.35) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL2536978 0.80 ALDH1A1 (0.35) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL786625 0.80 ALDH1A1 (0.35) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL12783788 0.79 TSHR (0.35) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL21819966 0.79 ALDH1A1 (0.38) ALDH1A1TP53HIF1ACYP3A4MAPK1
SCHEMBL221767 0.79
SCHEMBL13787844 0.79 ALDH1A1 (0.31) ALDH1A1TP53HIF1ACYP3A4MAPK1
Methane SCHEMBL4270398 0.77 ALDH1A1 (0.37) ALDH1A1TP53HIF1ACYP3A4MAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9052600-B2 Method for forming resist pattern and composition for forming protective film JSR CORPORATION (JP) 2015-06-09 US disclosed
EP-2486453-B1 POSITIVE-WORKING PHOTOIMAGEABLE BOTTOM ANTIREFLECTIVE COATING AZ ELECTRONIC MATERIALS USA (US) 2014-01-29 EP disclosed
US-8632948-B2 Positive-working photoimageable bottom antireflective coating AZ ELECTRONIC MATERIALS USA CORP. (US) 2014-01-21 US disclosed
US-20130059252-A1 METHOD FOR FORMING RESIST PATTERN AND COMPOSITION FOR FORMING PROTECTIVE FILM JSR CORPORATION (JP) 2013-03-07 US disclosed