SCHEMBL15024816

SCHEMBL15024816

O=C(CCN1CCOCC1)OCCC(F)(F)C(F)(F)CCC(F)(F)CC(F)(F)C(F)(F)F

nearest known ligand 0.40

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.40
GLA P06280 1/20 0.38
SMN1; SMN2 Q16637 1/20 0.36
KMT2A Q03164 4/20 0.34
MAPT P10636 3/20 0.34
THRB P10828 3/20 0.34
LMNA P02545 1/20 0.34
EPHX2 P34913 2/20 0.34
ATM Q13315 2/20 0.33
THRA P10827 1/20 0.33
KEAP1 Q14145 1/20 0.33
NFE2L2 Q16236 1/20 0.33
MEN1 O00255 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15024817 0.96 ALDH1A1 (0.40) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15025040 0.92 ALDH1A1 (0.40) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15025201 0.92 ALDH1A1 (0.40) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15025294 0.91 ALDH1A1 (0.44) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL20827590 0.84 ALDH1A1 (0.41) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15014711 0.84 ALDH1A1 (0.43) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15025065 0.81 ALDH1A1 (0.48) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL15025027 0.79 ALDH1A1 (0.43) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL13264855 0.78 GLA (0.47) ALDH1A1GLASMN1; SMN2KMT2AMAPT
SCHEMBL13264854 0.76 GLA (0.45) ALDH1A1GLASMN1; SMN2KMT2AMAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed