SCHEMBL15025115

SCHEMBL15025115

CC(CN1CCOCC1)CC(F)(F)CC(F)(C(F)(F)F)C(F)(F)F

nearest known ligand 0.38

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.38
USP2 O75604 1/20 0.38
MEN1 O00255 9/20 0.35
KMT2A Q03164 9/20 0.35
L3MBTL1 Q9Y468 1/20 0.32
LMNA P02545 1/20 0.32
KDM4E B2RXH2 1/20 0.32
ANPEP P15144 1/20 0.32
ATM Q13315 1/20 0.32
TSHR P16473 1/20 0.31
SMN1; SMN2 Q16637 1/20 0.30
NPC1 O15118 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15025386 0.81 USP2 (0.55) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL15025392 0.80 ALDH1A1 (0.35) ALDH1A1USP2MEN1KMT2ANPC1
SCHEMBL15025104 0.79 ALDH1A1 (0.39) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL15024838 0.79 ALDH1A1 (0.34) ALDH1A1USP2MEN1KMT2ANPC1
SCHEMBL15025100 0.78 ALDH1A1 (0.36) ALDH1A1USP2MEN1KMT2ALMNA
SCHEMBL15025252 0.75 ALDH1A1 (0.33) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL17828102 0.73 USP2 (0.58) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL14101853 0.70 USP2 (0.50) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL13980438 0.69 USP2 (0.55) ALDH1A1USP2MEN1KMT2AL3MBTL1
SCHEMBL15354727 0.68 USP2 (0.52) ALDH1A1USP2MEN1KMT2AL3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed