SCHEMBL15025359

SCHEMBL15025359

O=COC(COCCN1CCOCC1)CC(F)(F)C(F)(F)CC(F)(F)F

nearest known ligand 0.32

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.31
ALDH1A1 P00352 2/20 0.31
SLC6A3 Q01959 1/20 0.30
CYP1A2 P05177 1/20 0.30
CHRM2 P08172 1/20 0.30
CHRM1 P11229 1/20 0.30
HTR2A P28223 1/20 0.30
MAPK1 P28482 1/20 0.30
SCN1A P35498 1/20 0.30
HTR2B P41595 1/20 0.30
KCNH2 Q12809 1/20 0.30
SCN2A Q99250 1/20 0.30
SIGMAR1 Q99720 1/20 0.30
SCN3A Q9NY46 1/20 0.30
HRH3 Q9Y5N1 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15024861 0.82 KDM4E (0.37) ALDH1A1
SCHEMBL15024854 0.80 KDM4E (0.36) ALDH1A1
SCHEMBL15024853 0.79 TLR2 (0.38) TSHRALDH1A1CYP1A2CHRM2CHRM1
SCHEMBL15025103 0.79 USP2 (0.36) TSHRALDH1A1SLC6A3
SCHEMBL15025257 0.77 TLR2 (0.46) ALDH1A1MAPK1
SCHEMBL15025119 0.76 KDM4E (0.33) ALDH1A1
SCHEMBL15024852 0.73 USP2 (0.31) TSHR
SCHEMBL15025106 0.70
SCHEMBL15024850 0.70 KDM4E (0.36) ALDH1A1KCNH2SIGMAR1
SCHEMBL15025389 0.68 USP2 (0.32) ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed