SCHEMBL15028877

SCHEMBL15028877

CCC(C)(O[Si](C)(C)CC)[SiH](C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16656614 1.00
SCHEMBL15765700 0.84
SCHEMBL18911136 0.84
SCHEMBL15062043 0.81
SCHEMBL15028137 0.76
SCHEMBL15385074 0.74
SCHEMBL17029676 0.74
SCHEMBL15848892 0.74
SCHEMBL14849201 0.74
SCHEMBL18902680 0.72

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20170110360-A1 WAFER PROCESSING LAMINATE, TEMPORARY ADHESIVE MATERIAL FOR WAFER PROCESSING, AND METHOD FOR MANUFACTURING THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-04-20 US disclosed
US-20160189996-A1 WAFER PROCESSING LAMINATE, TEMPORARY ADHESIVE MATERIAL FOR WAFER PROCESSING, AND METHOD FOR MANUFACTURING THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-06-30 US disclosed
US-9235144-B2 Electrophotographic photosensitive member, process cartridge and electrophotographic apparatus CANON KABUSHIKI KAISHA (JP) 2016-01-12 US disclosed
US-9158191-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-10-13 US disclosed
US-8729148-B2 Photocurable dry film, method for preparing same, patterning method and film for protecting electric and electronic parts SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-05-20 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed