SCHEMBL15064567

SCHEMBL15064567

CC/C=C(/C[Si](OCC)(OCC)OCC)OCC1CO1

nearest known ligand 0.35

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.35
TP53 P04637 1/20 0.32
CYP3A4 P08684 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15064568 1.00 ALDH1A1 (0.35) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15065066 0.88 ALDH1A1 (0.37) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15065065 0.88 ALDH1A1 (0.37) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15065351 0.86 ALDH1A1 (0.36) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15065349 0.86 ALDH1A1 (0.36) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL27916735 0.79 ALDH1A1 (0.42) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15064890 0.76 ALDH1A1 (0.45) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15064719 0.76 ALDH1A1 (0.35) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL15064718 0.76 ALDH1A1 (0.35) ALDH1A1TP53CYP3A4SMN1; SMN2
SCHEMBL27916720 0.76 ALDH1A1 (0.40) ALDH1A1TP53CYP3A4SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2618216-B1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT HITACHI CHEMICAL CO LTD (JP) 2019-05-29 EP disclosed
US-8836089-B2 Positive photosensitive resin composition, method of creating resist pattern, and electronic component HITACHI CHEMICAL COMPANY, LTD. (JP) 2014-09-16 US disclosed
EP-2618216-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT Hitachi Chemical Co., Ltd. (JP) 2013-07-24 EP disclosed
US-20130168859-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT RESONAC CORPORATION (JP) 2013-07-04 US disclosed