SCHEMBL15065289

SCHEMBL15065289

C=CC(C[Si](OCC)(OCC)OCC)OCC1CO1

nearest known ligand 0.35

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.35
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15065214 0.85 ALDH1A1 (0.33) ALDH1A1
SCHEMBL15064566 0.84 ALDH1A1 (0.37) ALDH1A1
SCHEMBL15065577 0.84 SMN1; SMN2 (0.30) SMN1; SMN2
SCHEMBL15065575 0.84 SMN1; SMN2 (0.30) SMN1; SMN2
SCHEMBL15064776 0.79 ALDH1A1 (0.37) ALDH1A1
SCHEMBL27912286 0.79 ALDH1A1 (0.42) ALDH1A1SMN1; SMN2
SCHEMBL188407 0.78 SMN1; SMN2 (0.34) ALDH1A1SMN1; SMN2
SCHEMBL28063191 0.78 SMN1; SMN2 (0.34) ALDH1A1SMN1; SMN2
SCHEMBL231866 0.76 ALDH1A1 (0.34) ALDH1A1SMN1; SMN2
SCHEMBL5370788 0.76 SMN1; SMN2 (0.33) ALDH1A1SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2618216-B1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT HITACHI CHEMICAL CO LTD (JP) 2019-05-29 EP disclosed
US-8836089-B2 Positive photosensitive resin composition, method of creating resist pattern, and electronic component HITACHI CHEMICAL COMPANY, LTD. (JP) 2014-09-16 US disclosed
EP-2618216-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT Hitachi Chemical Co., Ltd. (JP) 2013-07-24 EP disclosed
US-20130168859-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF CREATING RESIST PATTERN, AND ELECTRONIC COMPONENT RESONAC CORPORATION (JP) 2013-07-04 US disclosed