SCHEMBL15082166

SCHEMBL15082166

CC(CI)c1ccc(O)cc1

nearest known ligand 0.64

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ESR1 P03372 7/20 0.59
ESR2 Q92731 6/20 0.59
PDCD1 Q15116 1/20 0.54
CD274 Q9NZQ7 1/20 0.54
MIF P14174 1/20 0.50
TDP1 Q9NUW8 3/20 0.48
CYP2C9 P11712 2/20 0.48
ALOX15 P16050 2/20 0.48
SLC6A2 P23975 2/20 0.48
LMNA P02545 1/20 0.48
CYP1A2 P05177 1/20 0.48
PGR P06401 1/20 0.48
CHRM2 P08172 1/20 0.48
CYP3A4 P08684 1/20 0.48
ADORA3 P0DMS8 1/20 0.48
AR P10275 1/20 0.48
CYP2D6 P10635 1/20 0.48
MAPT P10636 1/20 0.48
CHRM1 P11229 1/20 0.48
DRD1 P21728 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4936065 0.82 ESR1 (0.55) ESR1ESR2PDCD1CD274MIF
SCHEMBL6341136 0.80 ESR1 (0.64) ESR1ESR2PDCD1CD274MIF
SCHEMBL13876482 0.78 CYP1A2 (0.38) ESR1ESR2CYP1A2CYP2D6TAAR1
SCHEMBL20765447 0.78 ESR1 (0.62) ESR1ESR2PDCD1CD274MIF
SCHEMBL12195409 0.78 ESR1 (0.61) ESR1ESR2PDCD1CD274MIF
SCHEMBL17277247 0.78 ACHE (0.48) ESR1ESR2TDP1TAAR1SMN1; SMN2
SCHEMBL85692 0.78 ESR1 (0.62) ESR1ESR2PDCD1CD274MIF
SCHEMBL19245695 0.78 ESR1 (0.62) ESR1ESR2PDCD1CD274MIF
SCHEMBL548248 0.78 ESR1 (0.61) ESR1ESR2PDCD1CD274MIF
SCHEMBL16065316 0.78 ESR1 (0.62) ESR1ESR2PDCD1CD274MIF

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11541354-B2 Filtration device, refining device, and production method for liquid medicine FUJIFILM CORPORATION (JP) 2023-01-03 US disclosed
US-11543752-B2 Substrate processing method, substrate processing apparatus, and recipe selection method SCREEN Holdings Co., Ltd. (JP) 2023-01-03 US disclosed
US-20210294217-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2021-09-23 US disclosed
US-20210165328-A1 SUBSTRATE PROCESSING METHOD, SUBSTRATE PROCESSING APPARATUS, AND RECIPE SELECTION METHOD SCREEN Holdings Co., Ltd. (JP) 2021-06-03 US disclosed
US-20200360861-A1 FILTRATION DEVICE, REFINING DEVICE, AND PRODUCTION METHOD FOR LIQUID MEDICINE FUJIFILM CORPORATION (JP) 2020-11-19 US disclosed
US-10788754-B2 Pattern forming method and electronic device manufacturing method FUJIFILM CORPORATION (JP) 2020-09-29 US disclosed
US-10423068-B2 Active-light-sensitive or radiation-sensitive resin composition, active-light-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2019-09-24 US disclosed
US-20180120705-A1 PATTERN FORMING METHOD AND ELECTRONIC DEVICE MANUFACTURING METHOD FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed
US-9904168-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank provided with actinic ray-sensitive or radiation-sensitive film, pattern forming method, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2018-02-27 US disclosed
US-9766547-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, method of manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2017-09-19 US disclosed
US-20170242338-A1 ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-08-24 US disclosed
US-20170174801-A1 NON-CHEMICAL AMPLIFICATION TYPE RESIST COMPOSITION, NON-CHEMICAL AMPLIFICATION TYPE RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-06-22 US disclosed
US-20170121437-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, ELECTRONIC DEVICE, ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND MASK BLANK FUJIFILM CORPORATION (JP) 2017-05-04 US disclosed
US-20170059995-A1 PATTERN FORMING METHOD, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-03-02 US disclosed
WO-2013141395-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2013-09-26 WO disclosed
WO-2013100158-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM AND PATTERN FORMING METHOD, EACH USING THE SAME FUJIFILM CORPORATION (JP) 2013-07-04 WO disclosed