SCHEMBL15215840

SCHEMBL15215840

C=C(C)C(=O)OC12CC3CC(CC(OCC(=O)O)(C3)C1)C2

nearest known ligand 0.39

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
POLB P06746 1/20 0.31
ALDH1A1 P00352 2/20 0.31
TSHR P16473 1/20 0.31
DPP4 P27487 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL737596 0.87 ALDH1A1 (0.35) ALDH1A1TSHRDPP4
SCHEMBL12153603 0.86 GAA (0.33) ALDH1A1DPP4
SCHEMBL12170588 0.86 DPP4 (0.33) ALDH1A1DPP4
SCHEMBL18294129 0.84 ALDH1A1 (0.32) ALDH1A1TSHRDPP4
SCHEMBL14330861 0.84 NPSR1 (0.31) ALDH1A1DPP4
SCHEMBL18429993 0.84 ALDH1A1 (0.31) ALDH1A1TSHRDPP4
SCHEMBL4864929 0.83 GAA (0.31) ALDH1A1TSHRDPP4
SCHEMBL22811660 0.83 NPSR1 (0.32) ALDH1A1DPP4
SCHEMBL75678 0.83 NPSR1 (0.32) ALDH1A1DPP4
SCHEMBL16543389 0.83

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9513549-B2 Compound, resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-12-06 US disclosed
US-9513549-B2 Compound, resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-12-06 US disclosed
US-9164387-B2 Pattern-forming method, and radiation-sensitive resin composition JSR CORPORATION (JP) 2015-10-20 US disclosed
US-9122163-B2 2015-09-01 US disclosed
US-20150064622-A1 COMPOUND, RESIN, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-03-05 US disclosed
US-20150064622-A1 COMPOUND, RESIN, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-03-05 US disclosed
US-20130224661-A1 PATTERN-FORMING METHOD, AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2013-08-29 US disclosed