SCHEMBL15499713

SCHEMBL15499713

CC[C@](C)(S)c1ccc(C(C)(C)C)cc1

nearest known ligand 0.46

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.46
LMNA P02545 2/20 0.44
TYR P14679 1/20 0.44
BCHE P06276 11/20 0.40
ACHE P22303 11/20 0.40
KIF11 P52732 1/20 0.38
RAB9A P51151 2/20 0.37
POLB P06746 1/20 0.37
ATM Q13315 1/20 0.37
L3MBTL1 Q9Y468 1/20 0.37
ALDH1A1 P00352 2/20 0.37
NPC1 O15118 1/20 0.35
MAPT P10636 1/20 0.35
HPGD P15428 1/20 0.35
MAPK1 P28482 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10233171 1.00 TSHR (0.46) TSHRLMNATYRBCHEACHE
SCHEMBL15453139 0.83 ESR1 (0.44) RAB9ANPC1MAPT
SCHEMBL14421799 0.83 TSHR (0.50) TSHRLMNABCHEACHEKIF11
SCHEMBL17266463 0.83 NPC1 (0.47) LMNARAB9APOLBATMNPC1
SCHEMBL10252587 0.82 TSHR (0.48) TSHRLMNATYRBCHEACHE
SCHEMBL14527961 0.81 MEN1 (0.48) TSHRLMNAPOLBL3MBTL1MAPK1
SCHEMBL14540259 0.81 MEN1 (0.48) TSHRLMNAPOLBL3MBTL1MAPK1
SCHEMBL879532 0.80 TAAR1 (0.44) TSHRALDH1A1MAPTMAPK1
SCHEMBL14608023 0.80 TAAR1 (0.44) TSHRALDH1A1MAPTMAPK1
SCHEMBL12834072 0.80 TAAR1 (0.44) TSHRALDH1A1MAPTMAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20170102618-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2017-04-13 US disclosed
US-9250532-B2 Pattern forming method, multi-layered resist pattern, multi-layered film for organic solvent development, resist composition, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2016-02-02 US disclosed
US-8999621-B2 Pattern forming method, chemical amplification resist composition and resist film FUJIFILM CORPORATION (JP) 2015-04-07 US disclosed
US-8877423-B2 Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2014-11-04 US disclosed
US-8709704-B2 Pattern forming method using developer containing organic solvent and rinsing solution for use in the pattern forming method FUJIFILM CORPORATION (JP) 2014-04-29 US disclosed
US-20140060602-A1 ELECTRICALLY CONDUCTIVE COMPOSITION, AN ELECTRICALLY CONDUCTIVE FILM USING THE COMPOSITION AND A METHOD OF PRODUCING THE SAME FUJIFILM CORPORATION (JP) 2014-03-06 US disclosed
US-20120094237-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2012-04-19 US disclosed