SCHEMBL156205

SCHEMBL156205

CCOCC(C)C(=O)O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15866578 1.00
SCHEMBL28254202 0.91 ACE2 (0.37)
SCHEMBL15910175 0.87 GABRR1 (0.46)
SCHEMBL31461006 0.82 TSHR (0.39)
SCHEMBL3283814 0.81 HSD17B10 (0.54)
SCHEMBL17453558 0.81 NAALAD2 (0.38)
SCHEMBL15701348 0.80
SCHEMBL2925468 0.80
SCHEMBL20835209 0.79 MAPT (0.41)
SCHEMBL7081650 0.79 ALDH1A1 (0.37)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 702 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4616684-A1 LIQUID CRYSTALLINE SAM VIA SPIN-COAT ASSEMBLY AND THEIR AREA SELECTIVE DEPOSITION PROPERTIES Merck Patent GmbH (DE) 2025-09-17 EP claimed
WO-2024100183-A1 LIQUID CRYSTALLINE SAM VIA SPIN-COAT ASSEMBLY AND THEIR AREA SELECTIVE DEPOSITION PROPERTIES MERCK PATENT GMBH (DE) 2024-05-16 WO claimed
CN-115746616-A Surface-modified hollow silica particles and surface-modified hollow silica dispersion 凯斯科技股份有限公司 2023-03-07 CN claimed
EP-3497520-B1 BOTTOM ANTIREFLECTIVE COATING FORMING COMPOSITION MERCK PATENT GMBH (DE) 2020-10-21 EP claimed
US-10155879-B2 Compositions and use thereof for modification of substrate surfaces AZ Electronic Materials (Luxembourg) S.à.r.l. (LU) 2018-12-18 US claimed
US-9952510-B2 Thinner composition DONGWOO FINE-CHEM CO., LTD. (KR) 2018-04-24 US claimed
EP-2822050-B1 CHARGE-TRANSPORTING VARNISH NISSAN CHEMICAL IND LTD (JP) 2017-06-14 EP claimed
US-20160230129-A1 THINNER COMPOSITION DONGWOO FINE-CHEM CO., LTD. (KR) 2016-08-11 US claimed
EP-1798596-B1 Positive photoresist composition SHINETSU CHEMICAL CO (JP) 2012-08-01 EP claimed
JP-4804577-B2 2011-11-02 JP claimed
US-20100085518-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2010-04-08 US claimed
WO-2008102990-A1 PHOTO-SENSITIVE RESIN COMPOSITION FOR BLACK MATRIX, BLACK MATRIX PRODUCED BY THE COMPOSITION AND LIQUID CRYSTAL DISPLAY INCLUDING THE BLACK MATRIX LG CHEM, LTD. (KR) 2008-08-28 WO claimed
WO-2008078953-A1 BLACK MATRIX HIGH SENSITIVE PHOTORESIST COMPOSITION FOR LIQUID CRYSTAL DISPLAY AND BLACK MATRIX PREPARED BY USING THE SAME LG CHEM, LTD. (KR) 2008-07-03 WO claimed
WO-2008068197-A1 POLYISOCYANATE PREPARATIONS BASF SE (DE) 2008-06-12 WO claimed
US-20070060729-A1 Photosensitive resin composition and dry film resist using the same DONGJIN SEMICHEM CO., LTD. (KR) 2007-03-15 US claimed
WO-2004099876-A1 PHOTOSENSITIVE RESIN COMPOSITION AND DRY FILM RESIST USING THE SAME DONGJIN SEMICHEM CO., LTD. (KR) 2004-11-18 WO claimed
EP-1016698-B1 Use of a solvent composition containing an oxyisobutyric acid ester as a solvent in coatings, adhesives and printing inks MITSUBISHI RAYON CO (JP) 2004-09-22 EP claimed
EP-0907108-B1 Radiation-sensitive resin composition JSR CORP (JP) 2004-01-28 EP claimed
EP-0629671-B1 Solvent composition MITSUBISHI RAYON CO (JP) 2002-03-27 EP claimed
EP-0408635-B1 TRANSESTERIFICATION OF ALKOXYESTERS EASTMAN KODAK CO (US) 1994-02-23 EP claimed