SCHEMBL1696567

SCHEMBL1696567

C=CC(=O)Oc1ccc(OC(=O)C=C)c(C)c1

nearest known ligand 0.47

Predicted protein targets (top 17)

geneUniProtsupporting neighboursconfidence
THRB P10828 3/20 0.47
KMT2A Q03164 2/20 0.44
KDM4E B2RXH2 2/20 0.44
ALDH1A1 P00352 1/20 0.44
SMN1; SMN2 Q16637 1/20 0.44
L3MBTL1 Q9Y468 2/20 0.40
THRA P10827 1/20 0.40
TYMS P04818 1/20 0.38
PPARD Q03181 2/20 0.37
TDP1 Q9NUW8 2/20 0.37
NPC1 O15118 1/20 0.37
ACHE P22303 1/20 0.37
PDE6D O43924 1/20 0.36
MAPT P10636 1/20 0.35
PPARG P37231 1/20 0.35
PPARA Q07869 1/20 0.35
TGM2 P21980 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14173235 0.94 THRB (0.43) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL14173224 0.93 THRB (0.45) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL14173230 0.91 THRB (0.46) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL14173223 0.90 THRB (0.46) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL15908400 0.87 THRB (0.46) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL28986428 0.86 THRB (0.47) THRBKMT2AKDM4ETDP1MAPT
SCHEMBL39820 0.86 L3MBTL1 (0.47) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL30593911 0.86 L3MBTL1 (0.47) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL13048616 0.85 L3MBTL1 (0.50) THRBKMT2AKDM4EALDH1A1SMN1; SMN2
SCHEMBL16921467 0.85 THRB (0.44) THRBKMT2AKDM4EALDH1A1SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8536270-B2 Resist composition, resist layer, imprinting method, pattern formation, method for producing magnetic recording medium, and magnetic recording medium FUJIFILM (JP) 2013-09-17 US claimed
US-9005512-B2 Method for forming patterns and method for producing patterned substrates FUJIFILM CORPORATION (JP) 2015-04-14 US disclosed
US-8536270-B2 Resist composition, resist layer, imprinting method, pattern formation, method for producing magnetic recording medium, and magnetic recording medium FUJIFILM (JP) 2013-09-17 US disclosed
US-20130032971-A1 METHOD FOR FORMING PATTERNS AND METHOD FOR PRODUCING PATTERNED SUBSTRATES FUJIFILM CORPORATION (JP) 2013-02-07 US disclosed
WO-2012002556-A1 LIQUID APPLICATION DEVICE, LIQUID APPLICATION METHOD, AND NANOIMPRINT SYSTEM FUJIFILM CORPORATION (JP) 2012-01-05 WO disclosed
WO-2011126131-A1 PATTERN FORMING METHOD AND PROCESS FOR PRODUCING PATTERN SUBSTRATES FUJIFILM CORPORATION (JP) 2011-10-13 WO disclosed
US-20100247970-A1 RESIST COMPOSITION, RESIST LAYER, IMPRINTING METHOD, PATTERN FORMATION, METHOD FOR PRODUCING MAGNETIC RECORDING MEDIUM, AND MAGNETIC RECORDING MEDIUM FUJIFILM CORPORATION (JP) 2010-09-30 US disclosed