SCHEMBL17059137

SCHEMBL17059137

CCCc1cccc2[nH]c3ccc(O)cc3c12

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CDK4 P11802 3/20 0.50
CCND1 P24385 3/20 0.50
WEE1 P30291 4/20 0.47
CHEK1 O14757 3/20 0.47
TDP1 Q9NUW8 2/20 0.45
MEN1 O00255 2/20 0.45
POLB P06746 2/20 0.45
KMT2A Q03164 2/20 0.45
GAA P10253 1/20 0.45
CASP6 P55212 1/20 0.45
BCHE P06276 3/20 0.42
ACHE P22303 3/20 0.42
DAO P14920 1/20 0.42
DDO Q99489 1/20 0.42
HTR1D P28221 2/20 0.41
CYP1A2 P05177 1/20 0.41
CYP3A4 P08684 1/20 0.41
CYP2D6 P10635 1/20 0.41
CYP2C9 P11712 1/20 0.41
MAPK1 P28482 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29475607 0.81 BCHE (0.58) MEN1POLBKMT2ABCHEACHE
SCHEMBL6009655 0.81 BCHE (0.58) MEN1POLBKMT2ABCHEACHE
SCHEMBL6008274 0.79 BCHE (0.43) MEN1POLBKMT2ABCHEACHE
SCHEMBL27844288 0.75 BCHE (0.52) MEN1POLBKMT2ABCHEACHE
SCHEMBL28016354 0.73 HTR1A (0.49) MEN1KMT2AHTR1DHSD17B10
SCHEMBL11751554 0.73 ABCG2 (0.55) MEN1POLBKMT2AGAABCHE
SCHEMBL31287843 0.72 BCHE (0.55) MEN1POLBKMT2AGAABCHE
SCHEMBL2310171 0.72 BCHE (0.38) CDK4CCND1MEN1POLBKMT2A
SCHEMBL6008284 0.71 GPR84 (0.43) MEN1POLBKMT2ABCHEACHE
SCHEMBL6986225 0.70 HTR1D (0.73) TDP1MEN1KMT2AGAAHTR1D

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10042258-B2 Composition for forming a resist upper-layer film and method for producing a semiconductor device using the composition NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2018-08-07 US disclosed
US-20170293227-A1 COATING LIQUID FOR RESIST PATTERN COATING NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2017-10-12 US disclosed
US-9746768-B2 Resist overlayer film forming composition for lithography and method for producing semiconductor device using the same NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2017-08-29 US disclosed
US-20170205711-A1 COMPOSITION FOR FORMING A RESIST UPPER-LAYER FILM AND METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE USING THE COMPOSITION NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2017-07-20 US disclosed
US-9494864-B2 Resist overlayer film forming composition for lithography and method for manufacturing semiconductor device using the same NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-11-15 US disclosed
US-20150362835-A1 RESIST OVERLAYER FILM FORMING COMPOSITION FOR LITHOGRAPHY AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE USING THE SAME NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2015-12-17 US disclosed
US-20150248057-A1 RESIST OVERLAYER FILM FORMING COMPOSITION FOR LITHOGRAPHY AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2015-09-03 US disclosed