SCHEMBL17189686

SCHEMBL17189686

CC[N+](CC)(CC)CCOC(=O)C1CCCCC1C(=O)O

nearest known ligand 0.63

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
CHRM2 P08172 1/20 0.39
CHRM1 P11229 1/20 0.39
CHRM3 P20309 1/20 0.39
TP53 P04637 1/20 0.39
CYP3A4 P08684 1/20 0.39
PPM1B O75688 1/20 0.35
PTPN1 P18031 1/20 0.35
PPP1CC P36873 1/20 0.35
PEPD P12955 1/20 0.34
HTT P42858 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17189685 0.84 CHRM5 (0.44) CHRM2CHRM1CHRM3TP53CYP3A4
SCHEMBL1296712 0.82 PPM1B (0.50) TP53CYP3A4PPM1BPTPN1PPP1CC
SCHEMBL12974493 0.81 TP53 (0.50) TP53CYP3A4PEPD
SCHEMBL16352924 0.80 ALDH1A1 (0.44) CHRM2CHRM1CHRM3PPM1BPTPN1
Propylene Glycol SCHEMBL9893772 0.79 PPM1B (0.42) TP53CYP3A4PPM1BPTPN1PPP1CC
SCHEMBL16121021 0.79 ALDH1A1 (0.42) CHRM2CHRM1CHRM3TP53CYP3A4
SCHEMBL16352894 0.79 ALDH1A1 (0.46) CHRM2CHRM1CHRM3HTT
SCHEMBL5489415 0.79 ALDH1A1 (0.42) CHRM2CHRM1CHRM3TP53CYP3A4
SCHEMBL16121103 0.79 ALDH1A1 (0.42) CHRM2CHRM1CHRM3TP53CYP3A4
SCHEMBL1296512 0.79 ALDH1A1 (0.42) CHRM2CHRM1CHRM3TP53CYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20170153545-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-06-01 US disclosed
US-20170153545-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-06-01 US disclosed
US-20150301451-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-10-22 US disclosed
US-20150301451-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2015-10-22 US disclosed