SCHEMBL1719954

SCHEMBL1719954

CCNC(CC)CO

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10282542 1.00
SCHEMBL10282575 1.00
SCHEMBL1742998 0.90 LMNA (0.58)
SCHEMBL2348889 0.88
Ethambutol SCHEMBL4029 0.82 LMNA (1.00)
Ethambutol SCHEMBL2636850 0.82 LMNA (1.00)
Ethambutol SCHEMBL15479016 0.82 LMNA (1.00)
Ethambutol SCHEMBL3399 0.82 LMNA (1.00)
Ethambutol SCHEMBL2961583 0.82 LMNA (1.00)
Ethambutol SCHEMBL9906602 0.82 LMNA (1.00)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 205 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12325844-B2 Photoresist remover VERSUM MATERIALS US, LLC (US) 2025-06-10 US claimed
WO-2025108836-A1 COMPOSITIONS FOR REMOVING PHOTORESIST AND ETCH RESIDUES, METHODS OF USING AND USE THEREOF MERCK PATENT GMBH (DE) 2025-05-30 WO claimed
CN-118223024-A Etching solution for copper thick film 松下知识产权经营株式会社 2024-06-21 CN claimed
CN-112859552-B Application of vanadium oxide corrosion inhibition fluorine-containing stripping liquid 上海新阳半导体材料股份有限公司 2024-01-05 CN claimed
CN-112859553-B Vanadium oxide corrosion inhibition fluorine-containing stripping solution 上海新阳半导体材料股份有限公司 2023-11-10 CN claimed
CN-112859554-B Preparation method of vanadium oxide corrosion inhibition fluorine-containing stripping liquid 上海新阳半导体材料股份有限公司 2023-11-10 CN claimed
CN-110361941-B Positive photoresist stripping liquid, preparation method and application thereof 上海新阳半导体材料股份有限公司 2023-02-03 CN claimed
US-20220333044-A1 Photoresist Remover VERSUM MATERIALS US, LLC (US) 2022-10-20 US claimed
EP-4038173-A1 PHOTORESIST REMOVER Versum Materials US, LLC (US) 2022-08-10 EP claimed
EP-3037511-B1 SEMI-AQUEOUS PHOTORESIST OR SEMICONDUCTOR MANUFACTURING RESIDUE STRIPPING AND CLEANING COMPOSITION WITH IMPROVED SILICON PASSIVATION VERSUM MAT US LLC (US) 2022-07-06 EP claimed
EP-2649109-A1 POLYURETHANE ELASTOMERS MADE USING MIXTURES OF ALIPHATIC DIOL CHAIN EXTENDER AND SECONDARY AMINE Dow Global Technologies LLC (US) 2013-10-16 EP claimed
CN-102666745-A Conductive ink composition without forming particles and method for producing same DONGJIN SEMICHEM CO LTD 2012-09-12 CN claimed
WO-2012078322-A1 POLYURETHANE ELASTOMERS MADE USING MIXTURES OF ALIPHATIC DIOL CHAIN EXTENDER AND SECONDARY AMINE DOW GLOBAL TECHNOLOGIES LLC (US) 2012-06-14 WO claimed
EP-1031884-B1 Resist stripping agent and process of producing semiconductor devices using the same MITSUBISHI GAS CHEMICAL CO (JP) 2012-01-11 EP claimed
EP-2340811-A1 Ph-sensitive block copolymer forming polyionic complex micelles and drug or protein carrier using the same Sungkyunkwan University Foundation for Corporate Collaboration (KR) 2011-07-06 EP claimed
US-7968507-B2 Composition for stripping and stripping method SAMSUNG ELECTRONICS CO., LTD. (KR) 2011-06-28 US claimed
US-20110150978-A1 PH-SENSITIVE BLOCK COPOLYMER FORMING POLYIONIC COMPLEX MICELLES AND DRUG OR PROTEIN CARRIER USING THE SAME SUNGKYUNKWAN UNIVERSITY FOUNDATION FOR CORPORATE COLLABORATION (KR) 2011-06-23 US claimed
US-20090084406-A1 Composition for stripping and stripping method SAMSUNG ELECTRONICS CO., LTD. 2009-04-02 US claimed
CN-100406453-C 4-anilino-quinazoline derivatives as antiproliferative agents ASTRAZENECA AB (SE) 2008-07-30 CN claimed
CN-1809360-A 4-anilino-quinazoline derivatives as antiproliferative agents ASTRAZENECA AB (SE) 2006-07-26 CN claimed