SCHEMBL17515673

SCHEMBL17515673

CCC(C)(C)C(=O)OC(OC1CC2CCC1C2)C(C)C

nearest known ligand 0.34

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
GRM1 Q13255 2/20 0.34
ATM Q13315 1/20 0.33
EPHX2 P34913 1/20 0.32
CYP19A1 P11511 1/20 0.32
ALDH1A1 P00352 1/20 0.31
CTSV O60911 1/20 0.31
CTSL P07711 1/20 0.31
CTSS P25774 1/20 0.31
CTSK P43235 1/20 0.31
LNPEP Q9UIQ6 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL47404 0.87 GRM1 (0.36) GRM1ATMEPHX2CYP19A1ALDH1A1
SCHEMBL16591044 0.86 GRM1 (0.35) GRM1ATMEPHX2CYP19A1
SCHEMBL15082432 0.84 GRM1 (0.36) GRM1ATMEPHX2CYP19A1ALDH1A1
SCHEMBL16866412 0.82 GRM1 (0.36) GRM1ATMEPHX2CYP19A1ALDH1A1
SCHEMBL16591114 0.81 GRM1 (0.34) GRM1ATMEPHX2CYP19A1
SCHEMBL9924473 0.80 HSD11B1 (0.30)
SCHEMBL23383118 0.79 ATM (0.39) GRM1ATMCYP19A1ALDH1A1
SCHEMBL132929 0.78 ATM (0.46) GRM1ATMEPHX2CYP19A1CTSV
SCHEMBL14479488 0.78 ATM (0.46) GRM1ATMEPHX2CYP19A1CTSV
SCHEMBL9924475 0.77 MAPT (0.35) ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10031419-B2 Pattern forming method, composition kit and resist film, manufacturing method of electronic device using these, and electronic device FUJIFILM CORPORATION (JP) 2018-07-24 US disclosed
US-20180120701-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed
US-20160048075-A1 PATTERN FORMING METHOD, COMPOSITION KIT AND RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THESE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-02-18 US disclosed