SCHEMBL17548673

SCHEMBL17548673

CCOC(=O)C(F)(F)C(F)(F)C(F)(F)C(=O)OCCOC(=O)C(C)CC

nearest known ligand 0.38

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
MMP8 P22894 1/20 0.34
CA1 P00915 1/20 0.32
CA2 P00918 1/20 0.32
HSD17B10 Q99714 1/20 0.30
KDM4E B2RXH2 1/20 0.30
PKM P14618 1/20 0.30
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30
POLB P06746 1/20 0.30
NPSR1 Q6W5P4 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17548749 0.89 CA1 (0.32) CA1CA2
SCHEMBL17548747 0.89 CA1 (0.38) CA1CA2
SCHEMBL17548672 0.88 CA1 (0.31) CA1CA2
SCHEMBL18648116 0.87 CA1 (0.32) CA1CA2
SCHEMBL17548740 0.87 CA1 (0.43) CA1CA2
SCHEMBL17545693 0.87 MMP8 (0.36) MMP8CA1CA2HSD17B10KDM4E
SCHEMBL17548668 0.86 CA1 (0.45) CA1CA2
SCHEMBL13556126 0.85 CA1 (0.31) CA1CA2
SCHEMBL17548738 0.84 GAA (0.32) CA1CA2KDM4E
SCHEMBL13556133 0.84 MMP8 (0.34) MMP8KDM4EPKMMEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9740102-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 US disclosed
US-9638996-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-05-02 US disclosed
US-9599897-B2 Salt, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-03-21 US disclosed
US-9547240-B2 Resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-01-17 US disclosed
US-20160170300-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-06-16 US disclosed
US-20160062234-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-03 US disclosed