SCHEMBL17548756

SCHEMBL17548756

CCC(C)C(=O)OCCOC(=O)C(F)(F)C(F)(F)C(F)(F)C(=O)OC12CC3CC(CC(C3)C1)C2

nearest known ligand 0.33

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 2/20 0.33
CYP19A1 P11511 2/20 0.33
ALDH1A1 P00352 1/20 0.32
KMT2A Q03164 2/20 0.30
MEN1 O00255 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17548753 0.95 CYP19A1 (0.34) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL17545744 0.89 CYP19A1 (0.34) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL13556146 0.88 CYP19A1 (0.34) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL13556142 0.86 CYP17A1 (0.33) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL17545758 0.84 CYP19A1 (0.36) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL17545741 0.84 CYP19A1 (0.38) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL17548754 0.83 CYP19A1 (0.36) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL13556141 0.82 CYP19A1 (0.33) CYP17A1CYP19A1ALDH1A1
SCHEMBL25525745 0.81 CYP19A1 (0.37) CYP17A1CYP19A1ALDH1A1KMT2AMEN1
SCHEMBL17545787 0.81 CYP17A1 (0.33) CYP17A1CYP19A1ALDH1A1KMT2AMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9740102-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 US disclosed
US-9638996-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-05-02 US disclosed
US-9599897-B2 Salt, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-03-21 US disclosed
US-9547240-B2 Resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-01-17 US disclosed
US-20160170300-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-06-16 US disclosed
US-20160062234-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-03 US disclosed