SCHEMBL17548753

SCHEMBL17548753

CCC(C)C(=O)OCCOC(=O)C(F)(F)C(F)(F)C(=O)OC12CC3CC(CC(C3)C1)C2

nearest known ligand 0.34

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
CYP19A1 P11511 3/20 0.34
CYP17A1 P05093 2/20 0.34
ALDH1A1 P00352 4/20 0.33
KMT2A Q03164 4/20 0.32
MEN1 O00255 3/20 0.32
SMN1; SMN2 Q16637 1/20 0.31
MAPT P10636 1/20 0.30
ATM Q13315 1/20 0.30
L3MBTL1 Q9Y468 1/20 0.30
HTT P42858 1/20 0.30
NPSR1 Q6W5P4 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL17548756 0.95 CYP17A1 (0.33) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL13556146 0.90 CYP19A1 (0.34) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL17545758 0.88 CYP19A1 (0.36) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL13556142 0.88 CYP17A1 (0.33) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL13556141 0.84 CYP19A1 (0.33) CYP19A1CYP17A1ALDH1A1NPSR1
SCHEMBL17545744 0.84 CYP19A1 (0.34) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL17545756 0.83 CYP19A1 (0.40) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL17548752 0.82 CYP19A1 (0.38) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL16547493 0.80 CYP17A1 (0.34) CYP19A1CYP17A1ALDH1A1KMT2AMEN1
SCHEMBL26015556 0.79 THRB (0.38) CYP19A1CYP17A1ALDH1A1KMT2AMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9740102-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 US disclosed
US-9638996-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-05-02 US disclosed
US-9599897-B2 Salt, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-03-21 US disclosed
US-9547240-B2 Resin, photoresist composition, and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-01-17 US disclosed
US-20160170300-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-06-16 US disclosed
US-20160062234-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-03 US disclosed