SCHEMBL17830224

SCHEMBL17830224

C=C(COC(=O)C12CC3CC(CC(C3)C1)C2)C(=O)OC(C)(C)C

nearest known ligand 0.48

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 10/20 0.48
KMT2A Q03164 4/20 0.48
MEN1 O00255 3/20 0.48
MAPT P10636 3/20 0.48
NPSR1 Q6W5P4 2/20 0.48
PRKCA P17252 1/20 0.40
CYP17A1 P05093 2/20 0.40
CYP19A1 P11511 2/20 0.40
MAPK1 P28482 2/20 0.40
LMNA P02545 1/20 0.39
RECQL P46063 1/20 0.39
KDM4E B2RXH2 1/20 0.39
ATM Q13315 1/20 0.39
SMN1; SMN2 Q16637 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL135702 0.82 ALDH1A1 (0.53) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL17830226 0.79 ALDH1A1 (0.55) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL17830228 0.78 ALDH1A1 (0.43) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL17830225 0.77 ALDH1A1 (0.45) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL131064 0.76 CYP17A1 (0.55) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL13113297 0.73 MEN1 (0.33) ALDH1A1KMT2AMEN1CYP17A1CYP19A1
SCHEMBL15453467 0.72 EPHX2 (0.42) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL16731571 0.72 ALDH1A1 (0.50) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL5442806 0.71 NPSR1 (0.49) ALDH1A1KMT2AMEN1MAPTNPSR1
SCHEMBL953836 0.71 ALDH1A1 (0.42) ALDH1A1KMT2AMEN1MAPTNPSR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9740102-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 US disclosed
US-9740102-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-08-22 US disclosed
US-20160170300-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-06-16 US disclosed
US-20160170300-A1 PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-06-16 US disclosed