SCHEMBL18014664

SCHEMBL18014664

CCC(C)(C)C(=O)OCCC[Si](C)(C)O

nearest known ligand 0.35

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
CYP4F2 P78329 1/20 0.35
CYP4A11 Q02928 1/20 0.35
POLB P06746 1/20 0.32
GAA P10253 1/20 0.32
NPSR1 Q6W5P4 1/20 0.32
ALDH1A1 P00352 1/20 0.31
CYP3A4 P08684 1/20 0.31
CYP2D6 P10635 1/20 0.31
FKBP1A P62942 1/20 0.31
ACHE P22303 6/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18014657 0.89 CYP4F2 (0.35) CYP4F2CYP4A11ALDH1A1CYP3A4CYP2D6
SCHEMBL17249745 0.88 CYP4F2 (0.33) CYP4F2CYP4A11
SCHEMBL47561 0.87 CYP4F2 (0.36) CYP4F2CYP4A11ALDH1A1CYP3A4CYP2D6
SCHEMBL107666 0.87 CYP4F2 (0.36) CYP4F2CYP4A11ALDH1A1FKBP1AACHE
SCHEMBL17480216 0.85 CYP4F2 (0.33) CYP4F2CYP4A11FKBP1A
SCHEMBL47564 0.84 CYP4F2 (0.34) CYP4F2CYP4A11ALDH1A1CYP3A4CYP2D6
SCHEMBL20276245 0.84 CYP4F2 (0.34) CYP4F2CYP4A11ALDH1A1FKBP1A
SCHEMBL12130508 0.83 CYP4F2 (0.33) CYP4F2CYP4A11FKBP1A
SCHEMBL15356149 0.83 CYP4F2 (0.33) CYP4F2CYP4A11FKBP1A
SCHEMBL13667082 0.82 CYP4F2 (0.42) CYP4F2CYP4A11ALDH1A1FKBP1AACHE

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9971245-B2 Silicon-containing polymer, silicon-containing compound, composition for forming a resist under layer film, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-05-15 US disclosed
US-20160229939-A1 SILICON-CONTAINING POLYMER, SILICON-CONTAINING COMPOUND, COMPOSITION FOR FORMING A RESIST UNDER LAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-08-11 US disclosed