SCHEMBL18176988

SCHEMBL18176988

CCC(C)(C)C(=O)OC1(C(C)(CC)C2CC3CCC2O3)CCCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6367141 0.80
SCHEMBL119836 0.79
SCHEMBL6367684 0.74 SLC6A4 (0.34)
SCHEMBL6368066 0.73 SLC6A4 (0.34)
SCHEMBL18269894 0.71 ADORA3 (0.33)
SCHEMBL6367123 0.71 ADORA3 (0.33)
SCHEMBL18068643 0.71 ADORA3 (0.33)
SCHEMBL18176987 0.70 ADORA3 (0.33)
SCHEMBL17789336 0.70 ADORA3 (0.33)
SCHEMBL18176977 0.70 ADORA3 (0.33)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9952509-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, method for manufacturing electronic device, and electronic device FUJIFILM CORPORATION (JP) 2018-04-24 US disclosed
US-20180081271-A1 RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2018-03-22 US disclosed
US-20160313645-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-10-27 US disclosed